对DRAM和NAND闪存封装路由的考虑

Wang Ai-Chie, Chong Chin Hui
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引用次数: 0

摘要

随着存储器硅芯片的速度性能一代又一代的进步,相应的封装设计必须与所需的封装级性能保持一致。这促使封装设计人员为DDR2到DDR4 DRAM和NV-DDR到NV-DDR2 NAND闪存封装采用适当的封装路由设计实践,不仅要考虑封装的机械完整性,还要考虑封装的电气(信号完整性)方面。为了满足高速器件的电气要求,本文描述了BOC和COB中间层设计的相关封装路由考虑;这些结果已被记录下来,以确保在最终设计评审阶段检查这些路由要求,使美光能够向客户交付高质量的产品。
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Considerations for package routing for DRAM and NAND Flash memory
As the speed performance of memory silicon die advances over the generations, the corresponding package designs must align with the desired package-level performance. This has driven package designers to adopt the appropriate package routing design practices for DDR2 to DDR4 DRAM and NV-DDR to NV-DDR2 NAND Flash memory packages that keep not only the mechanical integrity of the package in mind but also the electrical (signal integrity) aspects of the package. This paper describes the relevant package routing considerations for BOC and COB interposer designs with the goal of meeting the electrical requirements for high-speed devices; these results have been documented to ensure that these routing requirements are checked at the final design review stage to enable Micron to deliver quality products to customers.
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