用于CMOS 65nm的sram的0.42至1.20 v读辅助电路

F. Abouzeid, S. Clerc, B. Pelloux-Prayer, P. Roche
{"title":"用于CMOS 65nm的sram的0.42至1.20 v读辅助电路","authors":"F. Abouzeid, S. Clerc, B. Pelloux-Prayer, P. Roche","doi":"10.1109/S3S.2013.6716578","DOIUrl":null,"url":null,"abstract":"This work presents an ultra-low voltage SRAM read frequency boost circuit developed in 65nm to cover the lack of reliable sense amplifiers. This circuit enables full swing read speed-up and bitline leakage compensation from 1.2V to 0.42V. Embedded in a 65nm 32kb 10T SRAM, it offers 10% frequency gain and 10-to-90% leakage energy reduction from nominal to ultra-low voltage supply.","PeriodicalId":219932,"journal":{"name":"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","volume":"65 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"0.42-to-1.20V read assist circuit for SRAMs in CMOS 65nm\",\"authors\":\"F. Abouzeid, S. Clerc, B. Pelloux-Prayer, P. Roche\",\"doi\":\"10.1109/S3S.2013.6716578\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents an ultra-low voltage SRAM read frequency boost circuit developed in 65nm to cover the lack of reliable sense amplifiers. This circuit enables full swing read speed-up and bitline leakage compensation from 1.2V to 0.42V. Embedded in a 65nm 32kb 10T SRAM, it offers 10% frequency gain and 10-to-90% leakage energy reduction from nominal to ultra-low voltage supply.\",\"PeriodicalId\":219932,\"journal\":{\"name\":\"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)\",\"volume\":\"65 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/S3S.2013.6716578\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/S3S.2013.6716578","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

这项工作提出了一种超低电压SRAM读频提升电路,开发在65nm,以弥补缺乏可靠的感测放大器。该电路可实现1.2V至0.42V的全摆幅读取加速和位线泄漏补偿。它嵌入在65nm 32kb 10T SRAM中,从标称电压到超低电压,它提供10%的频率增益和10- 90%的泄漏能量降低。
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0.42-to-1.20V read assist circuit for SRAMs in CMOS 65nm
This work presents an ultra-low voltage SRAM read frequency boost circuit developed in 65nm to cover the lack of reliable sense amplifiers. This circuit enables full swing read speed-up and bitline leakage compensation from 1.2V to 0.42V. Embedded in a 65nm 32kb 10T SRAM, it offers 10% frequency gain and 10-to-90% leakage energy reduction from nominal to ultra-low voltage supply.
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