用于测试电子CAD系统可靠性的测试线束的流程管理要求

Gunnar Bartels, P. M. Kist, Kees Schot, M. Sim
{"title":"用于测试电子CAD系统可靠性的测试线束的流程管理要求","authors":"Gunnar Bartels, P. M. Kist, Kees Schot, M. Sim","doi":"10.1109/EDTC.1994.326919","DOIUrl":null,"url":null,"abstract":"A test harness is a system for testing the reliability of electronic CAD systems (ECADS). Modern ECADS's utilize a framework component for basic services. Since frameworks were originally applied to ECADS's, little is known about the framework requirements for supporting a test harness. Previous work shows that the framework's design data manager can be used. We conclude here that a design flow manager, with slight adaptations, can be used as well. We provide a motivated list of flow requirements, give insight into good and bad features and discuss implementation aspects.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"100 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Flow management requirements of a test harness for testing the reliability of an electronic CAD system\",\"authors\":\"Gunnar Bartels, P. M. Kist, Kees Schot, M. Sim\",\"doi\":\"10.1109/EDTC.1994.326919\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A test harness is a system for testing the reliability of electronic CAD systems (ECADS). Modern ECADS's utilize a framework component for basic services. Since frameworks were originally applied to ECADS's, little is known about the framework requirements for supporting a test harness. Previous work shows that the framework's design data manager can be used. We conclude here that a design flow manager, with slight adaptations, can be used as well. We provide a motivated list of flow requirements, give insight into good and bad features and discuss implementation aspects.<<ETX>>\",\"PeriodicalId\":244297,\"journal\":{\"name\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"volume\":\"100 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1994.326919\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326919","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

测试线束是一种测试电子CAD系统(ECADS)可靠性的系统。现代ECADS利用一个框架组件来提供基本服务。由于框架最初是应用于ECADS的,所以人们对支持测试工具的框架需求知之甚少。以前的工作表明,该框架的设计数据管理器可以使用。我们在这里得出的结论是,稍加调整的设计流管理器也可以使用。我们提供了一个流需求的动机列表,给出了对好的和坏的特性的洞察,并讨论了实现方面。
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Flow management requirements of a test harness for testing the reliability of an electronic CAD system
A test harness is a system for testing the reliability of electronic CAD systems (ECADS). Modern ECADS's utilize a framework component for basic services. Since frameworks were originally applied to ECADS's, little is known about the framework requirements for supporting a test harness. Previous work shows that the framework's design data manager can be used. We conclude here that a design flow manager, with slight adaptations, can be used as well. We provide a motivated list of flow requirements, give insight into good and bad features and discuss implementation aspects.<>
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