{"title":"一种新的数字输出驱动宏建模方法及其在同步开关噪声分析中的应用","authors":"B. Buhrow, E. Daniel, B. Gilbert","doi":"10.1109/EPEP.2007.4387175","DOIUrl":null,"url":null,"abstract":"Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"106 4 Suppl 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A New Macromodeling Approach for Digital Output Drivers and Application in Simultaneous Switching Noise Analysis\",\"authors\":\"B. Buhrow, E. Daniel, B. Gilbert\",\"doi\":\"10.1109/EPEP.2007.4387175\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.\",\"PeriodicalId\":402571,\"journal\":{\"name\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"volume\":\"106 4 Suppl 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2007.4387175\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A New Macromodeling Approach for Digital Output Drivers and Application in Simultaneous Switching Noise Analysis
Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.
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