基于功率噪声诱导的PCIe Gen 3的高级相位抖动分析

Jong-Kyun Choi, Tae-Hoon Park, Jongjae Ryu, Chanyeong Jeong, Minseok Kang, S. Moon
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摘要

在这项工作中,我们提出了一种通过分析时钟网络中由功率噪声引起的随机抖动(RJ)和确定性抖动(DJ)来推导PCI Express (PCIe) Gen3的相位抖动(PJ)的方法。在以往的抖动分析方法中,在分析PCIe Gen3参考时钟网络的抖动时,没有考虑功率噪声的影响。我们应用该方法分析和验证了在三星4纳米工艺节点上实现的系统级芯片(SoC)设计中观察到的PCIe Gen3 PJ违规的主要噪声源。通过各种实验,我们发现造成这种违规的主要原因是50 MHz以下的功率噪声引起的抖动。通过修改电源管理集成电路(PMIC)以降低PMIC输出端的低频噪声,我们观察到时钟网络中的抖动减少了50%。
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Advanced Phase Jitter Analysis with Power Noise Induced Jitter Flow in PCIe Gen 3
In this work, we present a method to derive the phase jitter (PJ) of PCI Express (PCIe) Gen3 by analyzing both random jitter (RJ) and deterministic jitter (DJ) induced by power noise in a clock network. In the previous jitter analysis methods, the impact of power noise has not been considered when analyzing the jitter of PCIe Gen3 reference clock networks. We apply the proposed method to analyze and validate the main noise sources of PCIe Gen3 PJ violations observed in a system-on-chip (SoC) design implemented at Samsung's 4-nanometer process node. Through various experiments, we found that the main cause of the violation is jitter due to power noise below 50 MHz. By modifying the power management integrated circuit (PMIC) to reduce the low-frequency noise at the PMIC output, we observed a 50% reduction in jitter in the clock network.
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