{"title":"耦合互连树统计信号完整性分析的灵敏度方法","authors":"Zhigang Hao, G. Shi","doi":"10.1109/MWSCAS.2009.5236114","DOIUrl":null,"url":null,"abstract":"Capacitive and inductive coupling issues are hard to analyze in general; however, they are critical for signal integrity (SI) analysis in the contemporary integrated circuit technology. This paper presents a sensitivity based computation approach to coupled RLC trees for statistical signal integrity analysis. This technique is intended for use in SI-driven placement and routing.","PeriodicalId":254577,"journal":{"name":"2009 52nd IEEE International Midwest Symposium on Circuits and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Sensitivity approach to statistical signal integrity analysis of coupled interconnect trees\",\"authors\":\"Zhigang Hao, G. Shi\",\"doi\":\"10.1109/MWSCAS.2009.5236114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Capacitive and inductive coupling issues are hard to analyze in general; however, they are critical for signal integrity (SI) analysis in the contemporary integrated circuit technology. This paper presents a sensitivity based computation approach to coupled RLC trees for statistical signal integrity analysis. This technique is intended for use in SI-driven placement and routing.\",\"PeriodicalId\":254577,\"journal\":{\"name\":\"2009 52nd IEEE International Midwest Symposium on Circuits and Systems\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-09-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 52nd IEEE International Midwest Symposium on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2009.5236114\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 52nd IEEE International Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2009.5236114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Sensitivity approach to statistical signal integrity analysis of coupled interconnect trees
Capacitive and inductive coupling issues are hard to analyze in general; however, they are critical for signal integrity (SI) analysis in the contemporary integrated circuit technology. This paper presents a sensitivity based computation approach to coupled RLC trees for statistical signal integrity analysis. This technique is intended for use in SI-driven placement and routing.
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