G. Kajrys, P. Hinrichsen, A. Houdayer, J. Parpal, B. Noirhomme, J. Crine
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引用次数: 3
摘要
在一条使用了18年的25 kV XLPE地下电缆中,以50微米的间隔,在1.0和2.5 MeV的轰击能量下,对水树(2mm x 1mm)进行了二维微束pxe扫描。测定了Mg、Si、S、Cl、K、Ca、Pe的空间分布。除了在半xlpe界面处的变化外,Si和S的变化很小,而Mg、Cl和Ca的分布呈树状结构。树状区域的高浓度Mg, Cl和Ca表明这些杂质通过外部半导体扩散。K和Cl之间存在较高的空间相关性。
Two-dimensional Microbeam-pixe Elemental Scanning Of Water Trees In Field Aged Hv Cables
Two-dimensional microbeam-PIXE scans of a water tree (2 mm x 1 mm) in a 25 kV XLPE underground cable taken from service after 18 years have been made with 50 micron spacing at a bombarding energy of 1.0 and 2.5 MeV. The spatial distributions of Mg, Si, S, Cl, K, Ca and Pe were measured. While Si and S show only small variations, except for the change at the semicon-XLPE interface, the distributions of Mg, Cl and Ca show tree-like structures. The large concentrations of Mg, Cl and Ca in the tree region suggests the diffusion of these impurities via the outer semiconductor. A high spatial correlation between K and Cl was observed.