Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763336
R. E. Barker, D. B. Holt, F. Junghans
Modifications of the electrostatic probe techniques of Forster [1,2] and of Bloor and Morant [ 3 ] have been used to study the influence of additives, including extended chain ions such as sodium dodecyl sulfate ( S D S ) and dissolved polymers, on the distribution of electric potential C#J(X) across low conductivity liquids between parallel electrodes. The systems studied include toluene with dissolved polystyrene and n-octanol with dissolved SDS. It is thought that these s stems reflect some of the conditions relevant to transrormer fluids and also may be of significance in biophysical considerations [ 4 ] . The distribution of space charge p(x) is estimated by the application of Poisson's equation to the measured potential function @(x). From such data implications can be made about the effects of molecular interactions.
对Forster[1,2]以及Bloor和Morant[3]的静电探针技术进行了改进，用于研究添加剂(包括扩展链离子，如十二烷基硫酸钠(S D S)和溶解聚合物)对平行电极之间低电导率液体上电位c# J(X)分布的影响。所研究的体系包括甲苯与溶解聚苯乙烯和正辛醇与溶解SDS。据认为，这些系统反映了与转化流体相关的一些条件，也可能在生物物理学方面具有重要意义[4]。将泊松方程应用于测量的势函数@(x)，估计了空间电荷p(x)的分布。从这些数据可以推断出分子相互作用的影响。
{"title":"The Influence Of Ionic And Non-ionic Additives On The Electric Potential Distribution In Dielectric Liquids","authors":"R. E. Barker, D. B. Holt, F. Junghans","doi":"10.1109/CEIDP.1991.763336","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763336","url":null,"abstract":"Modifications of the electrostatic probe techniques of Forster [1,2] and of Bloor and Morant [ 3 ] have been used to study the influence of additives, including extended chain ions such as sodium dodecyl sulfate ( S D S ) and dissolved polymers, on the distribution of electric potential C#J(X) across low conductivity liquids between parallel electrodes. The systems studied include toluene with dissolved polystyrene and n-octanol with dissolved SDS. It is thought that these s stems reflect some of the conditions relevant to transrormer fluids and also may be of significance in biophysical considerations [ 4 ] . The distribution of space charge p(x) is estimated by the application of Poisson's equation to the measured potential function @(x). From such data implications can be made about the effects of molecular interactions.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"212 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116998050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763967
S. Alam
Fatty acid films may provide a good substitute as dielectric medium for MIS (metal-insulator-semionductor) technology. This paper discusses capacitance vs voltage (C-V) characteristics of metal/stearic acid/semiconductor devices formed on p-type silicon with thin native silicon dioxide (Si/sub 2/) layers. Variable frequency C-V plots display anomalous frequency dispersion in the negative bias voltage region and a reduction of the dispersion in the positive bias region. This can be attributed to the formation of interface states at the SiO/sub 2//stearic acid insulator boundary. C-V characteristics of MIS samples which have been subjected to thermal stress are also discussed. In these studies we have observed both a voltage and capacitance shift with respect to the unstressed specimens. The observed voltage shift is presumably due to the presence of mobile space charges moving to the SiO/sub 2//stearic acid boundary. The shift in capacitance in the stressed samples may have been caused by annealing of stearic acid films when they undergo thermal stress.
{"title":"Capacitance Voltage Characteristics Of Stearic Acid Insulating Films In Mis Devices","authors":"S. Alam","doi":"10.1109/CEIDP.1991.763967","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763967","url":null,"abstract":"Fatty acid films may provide a good substitute as dielectric medium for MIS (metal-insulator-semionductor) technology. This paper discusses capacitance vs voltage (C-V) characteristics of metal/stearic acid/semiconductor devices formed on p-type silicon with thin native silicon dioxide (Si/sub 2/) layers. Variable frequency C-V plots display anomalous frequency dispersion in the negative bias voltage region and a reduction of the dispersion in the positive bias region. This can be attributed to the formation of interface states at the SiO/sub 2//stearic acid insulator boundary. C-V characteristics of MIS samples which have been subjected to thermal stress are also discussed. In these studies we have observed both a voltage and capacitance shift with respect to the unstressed specimens. The observed voltage shift is presumably due to the presence of mobile space charges moving to the SiO/sub 2//stearic acid boundary. The shift in capacitance in the stressed samples may have been caused by annealing of stearic acid films when they undergo thermal stress.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"331 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116442610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763375
R. Fouracre, Li Huimim, B. Crichton, V. Banks
The role of ions in the treeing process appears crucial to the understanding of water treeing [l] and has been extensively studied. widely found [1,2]. An increased ionic concentration has been found both in the visibly treed region and also just in front of the tree 131. The presence of ions and possible morphological changes in the treed material imply that the electrical properties of the stressed material may also have some ion-specific behaviour.
{"title":"The Influence Of Ions On The Dc Conductivity And Thermally Stimulated Discharge Current (TSDC) Spectra Of Water Treed Additive Free Low Density Polyethylene","authors":"R. Fouracre, Li Huimim, B. Crichton, V. Banks","doi":"10.1109/CEIDP.1991.763375","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763375","url":null,"abstract":"The role of ions in the treeing process appears crucial to the understanding of water treeing [l] and has been extensively studied. widely found [1,2]. An increased ionic concentration has been found both in the visibly treed region and also just in front of the tree 131. The presence of ions and possible morphological changes in the treed material imply that the electrical properties of the stressed material may also have some ion-specific behaviour.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"365 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116558253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763966
I. Terayama, Y. Kenmochi, J. Kobayashi, N. Iijima, H. Mitsui, M. Sone
1.Introduction In general, it is known that a life time of dry type transformer is reduced remarkably by partial discharges. The quality of insulation is kept constant as possible in the factory, but sometimes it is scattered by some reasons. The reliability of the products is much influenced by scatters of the quality. Therefore, it is very important to predict the life time of the products. So far it was done by measuring a withstand voltage. However, the withstand voltage test means a destruction of the products, so it is necessary to predict the life time by using undestructive tests. As an undestructive test, the magnitude of the partial discharge will be adaptable to an expert system for life time prediction. General expert systems were based on some threshold value, which did not have an objective meaning. So it is necessary to evaluate more objectively. By using an expert system with fuzzy clustering, it can be done to make a judgment taking the interactions of each data into considerat ion. Even if a characteristic of life time is not clear, this type of expert systems can establish an optimum expert with learning, and can watch not only the products but also the relationship between conditions of manufacturing machines and life. However, fuzzy clustering has a flaw that if data numbers increases, handling time becomes extremely long. So, it can not to do real time diagnosis of the products in manufacturing line. Therefore, we apply a high speed algorism using DSP (Digital Signal Processor) with high calculating speed to our expert system. In this paper, we suggest a diagnosis expert system for the life time of transformers by using fuzzy clustering and describe a method of prediction of life time in the manufacturing line.
{"title":"Diagnosis expert system for the life time of transformers by using fuzzy Clustering","authors":"I. Terayama, Y. Kenmochi, J. Kobayashi, N. Iijima, H. Mitsui, M. Sone","doi":"10.1109/CEIDP.1991.763966","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763966","url":null,"abstract":"1.Introduction In general, it is known that a life time of dry type transformer is reduced remarkably by partial discharges. The quality of insulation is kept constant as possible in the factory, but sometimes it is scattered by some reasons. The reliability of the products is much influenced by scatters of the quality. Therefore, it is very important to predict the life time of the products. So far it was done by measuring a withstand voltage. However, the withstand voltage test means a destruction of the products, so it is necessary to predict the life time by using undestructive tests. As an undestructive test, the magnitude of the partial discharge will be adaptable to an expert system for life time prediction. General expert systems were based on some threshold value, which did not have an objective meaning. So it is necessary to evaluate more objectively. By using an expert system with fuzzy clustering, it can be done to make a judgment taking the interactions of each data into considerat ion. Even if a characteristic of life time is not clear, this type of expert systems can establish an optimum expert with learning, and can watch not only the products but also the relationship between conditions of manufacturing machines and life. However, fuzzy clustering has a flaw that if data numbers increases, handling time becomes extremely long. So, it can not to do real time diagnosis of the products in manufacturing line. Therefore, we apply a high speed algorism using DSP (Digital Signal Processor) with high calculating speed to our expert system. In this paper, we suggest a diagnosis expert system for the life time of transformers by using fuzzy clustering and describe a method of prediction of life time in the manufacturing line.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129520835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763382
S. Moody, V. Banks, A. Vaughan
Electrical stress in the presence of water, ionic contaminants and oxidation products may cause water tree growth in medium voltage polymeric insulated cables. The water trees may either be in the form of vented trees which grow from the semi-conducting screen interfaces o r bowtie trees which grow from defects in the bulk of the insulation. This water tree growth may cause a decrease in the electric strength of the cable, thereby increasing the probability of failure. A large number of studies have, therefore, been carried out into examining the phenomenon of water treeing jn medium voltage cables[l-3].
{"title":"A preliminary study of the relationship between matrix morphology and water treeing in medium voltage polymeric insulated cable","authors":"S. Moody, V. Banks, A. Vaughan","doi":"10.1109/CEIDP.1991.763382","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763382","url":null,"abstract":"Electrical stress in the presence of water, ionic contaminants and oxidation products may cause water tree growth in medium voltage polymeric insulated cables. The water trees may either be in the form of vented trees which grow from the semi-conducting screen interfaces o r bowtie trees which grow from defects in the bulk of the insulation. This water tree growth may cause a decrease in the electric strength of the cable, thereby increasing the probability of failure. A large number of studies have, therefore, been carried out into examining the phenomenon of water treeing jn medium voltage cables[l-3].","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128265619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763374
S. Bamji, A. Bulinski, R. Densley
{"title":"Final Breakdown Mechanism Of Water Treeing","authors":"S. Bamji, A. Bulinski, R. Densley","doi":"10.1109/CEIDP.1991.763374","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763374","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121289596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763950
I. Sauers
{"title":"Evidence for SF/sub 4/ and SF/sub 2/ formation in SF/sub 6/ corona discharges","authors":"I. Sauers","doi":"10.1109/CEIDP.1991.763950","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763950","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121396199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763344
J. Nelson, M. Brubaker, S. Lindgren
Several of the transformer failures which have been attributable to static electrification have occurred within a few hours of energization in the absence of known system overvoltages. This suggests that perhaps thermal processes having a long time constant have been involved with the accumulation of static charge, since the electrification process is known to be a function of temperature [I]. Since temperature affects most of the factors involved, the predominant variable by which temperature influences charge accumulation (mobility, viscosity, conductivity, etc.) is not always evident.
{"title":"The Operation Of Moisture Equilibrium In Determining Electrification In Oil/cellulose Structures","authors":"J. Nelson, M. Brubaker, S. Lindgren","doi":"10.1109/CEIDP.1991.763344","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763344","url":null,"abstract":"Several of the transformer failures which have been attributable to static electrification have occurred within a few hours of energization in the absence of known system overvoltages. This suggests that perhaps thermal processes having a long time constant have been involved with the accumulation of static charge, since the electrification process is known to be a function of temperature [I]. Since temperature affects most of the factors involved, the predominant variable by which temperature influences charge accumulation (mobility, viscosity, conductivity, etc.) is not always evident.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126241520","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763946
D.H. Ren, A. Watson
From an e a r l i e r study in s i l i c o n e o i l , the average cur ren t response t o r i s i n g and f a l l i n g vol tage appears on a log-log s c a l e with two l i n e a r port ions which a r e sharply divided a t high f i e l d [l]. Both of these two port ions obey the equation I a VS, i n which Su and Si a r e re fer red t o as the upper s lope and lower slope. Figure 1 gives a typical p l o t o f the average cur ren t a s a function of the t r i a n g u l a r applied voltage i n log-log sca le . According t o a theory o f charge t ranspor t in d i e l e c t r i c l iqu id [Z] , i t i s proposed t h a t under slow t r i a n g u l a r voltage waveform appl ica t ion t h e process may occur by in jec t ion of e lec t rons from the cathode in t h e highest f i e l d region. The lower s lope represents the cur ren t c h a r a c t e r i s t i c in the lower (intermediate) f i e l d region. The lower s lope i n the intermediate f i e l d s t rength regime has not so f a r been invest igated c lose ly . I t has been hypothesized t h a t the lower s lope o r i g i n a t e s in some pos i t ive ion i n j e c t i o n process very much as e lec t rons are in jec ted from t h e cathode a t the highest f i e l d s t rengths . Indeed, s i l i c o n e o i l i s a homocharge 1 iquid according t o the c l a s s i f i c a t i o n of Guizonnier [3] and as such wil l have e lec t ron i n j e c t i o n under the control of the cathode material sur face while pos i t ive ion production i s determined by the anode. In addi t ion t o any such process, pos i t ive ions can appear and remain in the l iqu id from other mechanisms.
从e r l我e r研究s l c o n e o我l,平均cur任t响应t o r is我l n g和f l n g卷天出现在双对数s c a l e与2 l i n e r港口离子急剧r e / t高f e l d (l)。这两个端口离子都服从方程I a VS，其中Su和Si分别表示为上斜率和下斜率。图1给出了一个典型的p - 1曲线，它表示平均电流为t - 1的函数，它是t - 1的函数，它表示施加电压为l - 1的函数。根据t o理论o f t ranspor t在d我e l e c t r c l iqu id [Z],我t s提出t h t下缓慢我l n g u r电压波形:ica t离子t h e过程可能发生的份额t e lec的离子从阴极罗恩t h e最高f e l d区域。较低的s线表示当前的电流，而在较低(中间)的区域则表示当前的电流。较低的区间是在中间区间，而较低的区间则是在中间区间。如果假设它是在较低的阴极上，它是在较低的阴极上，它是在较低的阴极上，它是在较低的阴极上，它是在较低的阴极上，它是在较低的阴极上，它是在较低的阴极上，它是在最高的阴极上，它是在最高的阴极上。实际上，根据Guizonnier[3]的说法，它是一种同电荷液体，如果它是一种同电荷液体，那么它就会在阴极材料表面的控制下被释放出来，而正极材料表面的正极离子产生是由阳极决定的。除了上述过程外，离子还可以通过其他机制出现并留在液体中。
{"title":"Charge Injection Into Dielectric Oil From The Anode Or Cathode Under Ramped Voltage Application","authors":"D.H. Ren, A. Watson","doi":"10.1109/CEIDP.1991.763946","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763946","url":null,"abstract":"From an e a r l i e r study in s i l i c o n e o i l , the average cur ren t response t o r i s i n g and f a l l i n g vol tage appears on a log-log s c a l e with two l i n e a r port ions which a r e sharply divided a t high f i e l d [l]. Both of these two port ions obey the equation I a VS, i n which Su and Si a r e re fer red t o as the upper s lope and lower slope. Figure 1 gives a typical p l o t o f the average cur ren t a s a function of the t r i a n g u l a r applied voltage i n log-log sca le . According t o a theory o f charge t ranspor t in d i e l e c t r i c l iqu id [Z] , i t i s proposed t h a t under slow t r i a n g u l a r voltage waveform appl ica t ion t h e process may occur by in jec t ion of e lec t rons from the cathode in t h e highest f i e l d region. The lower s lope represents the cur ren t c h a r a c t e r i s t i c in the lower (intermediate) f i e l d region. The lower s lope i n the intermediate f i e l d s t rength regime has not so f a r been invest igated c lose ly . I t has been hypothesized t h a t the lower s lope o r i g i n a t e s in some pos i t ive ion i n j e c t i o n process very much as e lec t rons are in jec ted from t h e cathode a t the highest f i e l d s t rengths . Indeed, s i l i c o n e o i l i s a homocharge 1 iquid according t o the c l a s s i f i c a t i o n of Guizonnier [3] and as such wil l have e lec t ron i n j e c t i o n under the control of the cathode material sur face while pos i t ive ion production i s determined by the anode. In addi t ion t o any such process, pos i t ive ions can appear and remain in the l iqu id from other mechanisms.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132559055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763381
J. Parpal
Samples of polyethylene with electrical trees at the tip of a needle radius/9 mm gap) molded into the material were subjected to voltage impulses of between 50 and 85 kV (20 ns/2 /spl mu/s). The light emitted from the partial discharges was recorded with a streak camera. Light was emitted for less than 20 ns for a positive impulse of 70 kV. The recorded light was located in the region of the electrical tree and the "length" of the recorded light increased with the growth of the tree. There was degradation of the emitting region after many impulses, except in one branch. The rate of growth of the electrical tree leading to final breakdown depends also on the mechanical stress applied sample.
{"title":"Streak Camera Observations of Partial Discharg Polyethylene under Fast Impulse Voltage Stress","authors":"J. Parpal","doi":"10.1109/CEIDP.1991.763381","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763381","url":null,"abstract":"Samples of polyethylene with electrical trees at the tip of a needle radius/9 mm gap) molded into the material were subjected to voltage impulses of between 50 and 85 kV (20 ns/2 /spl mu/s). The light emitted from the partial discharges was recorded with a streak camera. Light was emitted for less than 20 ns for a positive impulse of 70 kV. The recorded light was located in the region of the electrical tree and the \"length\" of the recorded light increased with the growth of the tree. There was degradation of the emitting region after many impulses, except in one branch. The rate of growth of the electrical tree leading to final breakdown depends also on the mechanical stress applied sample.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133071450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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