J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. Wagner, C. David, M. Makita, P. Vagovič
{"title":"瑞士fel - kb光学波长波前特性","authors":"J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. Wagner, C. David, M. Makita, P. Vagovič","doi":"10.1117/12.2665587","DOIUrl":null,"url":null,"abstract":"Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir´e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.","PeriodicalId":376481,"journal":{"name":"Optics + Optoelectronics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SwissFEL KB-optics at-wavelength wavefront characterisation\",\"authors\":\"J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. Wagner, C. David, M. Makita, P. Vagovič\",\"doi\":\"10.1117/12.2665587\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir´e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.\",\"PeriodicalId\":376481,\"journal\":{\"name\":\"Optics + Optoelectronics\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics + Optoelectronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2665587\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics + Optoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2665587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir´e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.
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