Kwon-sik Park, Byuong-Jun Seo, Kyoung-Suk Kang, Kwang-Rae Jo, Hee-Chang Choi, E. Nho
{"title":"基于mmc的电压源高压直流系统的子模块测试电路","authors":"Kwon-sik Park, Byuong-Jun Seo, Kyoung-Suk Kang, Kwang-Rae Jo, Hee-Chang Choi, E. Nho","doi":"10.1109/ECCE.2018.8558261","DOIUrl":null,"url":null,"abstract":"A Voltage Sourced Converter (VSC) for High Voltage Direct Current (HVDC) operates in extremely high voltage and high-power conditions. Especially in case of Modular Multilevel Converter (MMC), hundreds of submodules are connected in series to meet the high voltage requirement. IEC 62501 suggests several tests such as the operational tests for a valve consisting of several submodules and the dielectric tests, etc. This paper proposes a new test circuit for the submodule in MMC-based HVDC system. Simulations are carried out for a system with the power rating of 2.4 [kV] and 485 [A], and both the simulation and scaled down experimental results show the validity of the proposed test circuit.","PeriodicalId":415217,"journal":{"name":"2018 IEEE Energy Conversion Congress and Exposition (ECCE)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Submodule Test Circuit for MMC-based Voltage Sourced HVDC System\",\"authors\":\"Kwon-sik Park, Byuong-Jun Seo, Kyoung-Suk Kang, Kwang-Rae Jo, Hee-Chang Choi, E. Nho\",\"doi\":\"10.1109/ECCE.2018.8558261\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A Voltage Sourced Converter (VSC) for High Voltage Direct Current (HVDC) operates in extremely high voltage and high-power conditions. Especially in case of Modular Multilevel Converter (MMC), hundreds of submodules are connected in series to meet the high voltage requirement. IEC 62501 suggests several tests such as the operational tests for a valve consisting of several submodules and the dielectric tests, etc. This paper proposes a new test circuit for the submodule in MMC-based HVDC system. Simulations are carried out for a system with the power rating of 2.4 [kV] and 485 [A], and both the simulation and scaled down experimental results show the validity of the proposed test circuit.\",\"PeriodicalId\":415217,\"journal\":{\"name\":\"2018 IEEE Energy Conversion Congress and Exposition (ECCE)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Energy Conversion Congress and Exposition (ECCE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCE.2018.8558261\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Energy Conversion Congress and Exposition (ECCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCE.2018.8558261","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Submodule Test Circuit for MMC-based Voltage Sourced HVDC System
A Voltage Sourced Converter (VSC) for High Voltage Direct Current (HVDC) operates in extremely high voltage and high-power conditions. Especially in case of Modular Multilevel Converter (MMC), hundreds of submodules are connected in series to meet the high voltage requirement. IEC 62501 suggests several tests such as the operational tests for a valve consisting of several submodules and the dielectric tests, etc. This paper proposes a new test circuit for the submodule in MMC-based HVDC system. Simulations are carried out for a system with the power rating of 2.4 [kV] and 485 [A], and both the simulation and scaled down experimental results show the validity of the proposed test circuit.