Reduced Aperture Flanged Rectangular Waveguide Probe for Measurement of Conductor Backed Uniaxial Materials

An algorithm is developed for the non-destructive extraction of constitutive parameters from uniaxial anisotropic materials backed by a conductive layer. A method of moments-based approach is used in conjunction with a previously-determined Green function. A dominant-mode analysis is done for rapid comparison of the derived forward model with that of commercially-available software. Finally, laboratory measurements are taken to compare this approach to that of a destructive, high-precision method.