一个沟槽隔离厚SOI工艺作为平台的各种电气和光学集成器件

R. Lerner, D. Gaebler, K. Schottmann, S. Hering
{"title":"一个沟槽隔离厚SOI工艺作为平台的各种电气和光学集成器件","authors":"R. Lerner, D. Gaebler, K. Schottmann, S. Hering","doi":"10.1109/S3S.2013.6716538","DOIUrl":null,"url":null,"abstract":"The integration of various new optical and high voltage devices into an existing trench isolated 650 V BCD process on thick SOI wafers with a minimum of additional processing effort is reported. The trench isolation together with the thickness of the SOI wafer allows the construction of isolated photodiodes with excellent response even for red and infrared wavelengths. Furthermore the thick SOI material enables the integration of vertical high voltage devices like NPN bipolar transistors. Together with a special collector design the SOI topology allows the integration of IGBT devices which can be tuned by design measures only between on-state and switching performance.","PeriodicalId":219932,"journal":{"name":"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A trench isolated thick SOI process as platform for various electrical and optical integrated devices\",\"authors\":\"R. Lerner, D. Gaebler, K. Schottmann, S. Hering\",\"doi\":\"10.1109/S3S.2013.6716538\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The integration of various new optical and high voltage devices into an existing trench isolated 650 V BCD process on thick SOI wafers with a minimum of additional processing effort is reported. The trench isolation together with the thickness of the SOI wafer allows the construction of isolated photodiodes with excellent response even for red and infrared wavelengths. Furthermore the thick SOI material enables the integration of vertical high voltage devices like NPN bipolar transistors. Together with a special collector design the SOI topology allows the integration of IGBT devices which can be tuned by design measures only between on-state and switching performance.\",\"PeriodicalId\":219932,\"journal\":{\"name\":\"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/S3S.2013.6716538\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/S3S.2013.6716538","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

将各种新的光学和高压器件集成到现有的沟槽隔离650 V BCD工艺中,并在厚SOI晶圆上进行最小的额外处理工作。沟槽隔离以及SOI晶圆的厚度允许构建隔离的光电二极管,即使对红色和红外波长也具有出色的响应。此外,厚SOI材料可以集成垂直高压器件,如NPN双极晶体管。与特殊的集电极设计一起,SOI拓扑允许集成IGBT器件,这些器件可以通过设计措施仅在导通状态和开关性能之间进行调整。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A trench isolated thick SOI process as platform for various electrical and optical integrated devices
The integration of various new optical and high voltage devices into an existing trench isolated 650 V BCD process on thick SOI wafers with a minimum of additional processing effort is reported. The trench isolation together with the thickness of the SOI wafer allows the construction of isolated photodiodes with excellent response even for red and infrared wavelengths. Furthermore the thick SOI material enables the integration of vertical high voltage devices like NPN bipolar transistors. Together with a special collector design the SOI topology allows the integration of IGBT devices which can be tuned by design measures only between on-state and switching performance.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Direct point-contact characterization of Bias instability on bare SOI wafers Parallelism and pipelining in ultra low voltage digital circuits Enabling Sub-nW RF circuits through subthreshold leakage management Low power false positive tolerant event detector for seismic sensors Practical process flows for monolithic 3D
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1