Methods for lifetime characterization of concentric circuit boards

The paper presents development of simulation method and measuring system for a lifetime characterization of concentric circuit boards. It brings a knowledge about modern approaches of structure lifetime estimation by using a FEM (finite element method) modelling. Methods known in the field of mechanical engineering and material engineering are extended by the author with the new knowledge and applied for development of new lifetime evaluation method. The testing is done by using the specific mechanical bending test apparatus which is designed to achieve equivalent results as can be achieved by the cyclic tests in the thermal chamber. The structure damage is generated by using a mechanical force generated by the pneumatic piston. Tested concentric circuit boards are mainly used in LED lamps. The boards are characterized by a circular shape, concentrically mounted components and high operating temperatures.