S. Sacarisen, M. Stambaugh, P. Lou, A. Khosrovi, Ki Chang
{"title":"为可测试性而设计的VLSI通信处理器","authors":"S. Sacarisen, M. Stambaugh, P. Lou, A. Khosrovi, Ki Chang","doi":"10.1109/ISSCC.1984.1156646","DOIUrl":null,"url":null,"abstract":"A 16b processor for control of digital communication networks, with 2186 bytes of RAM will be discussed. The chip features include instruction fault detection, I/O parity check/ generation and special test modes.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A VLSI communication processor designed for testability\",\"authors\":\"S. Sacarisen, M. Stambaugh, P. Lou, A. Khosrovi, Ki Chang\",\"doi\":\"10.1109/ISSCC.1984.1156646\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 16b processor for control of digital communication networks, with 2186 bytes of RAM will be discussed. The chip features include instruction fault detection, I/O parity check/ generation and special test modes.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156646\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156646","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A VLSI communication processor designed for testability
A 16b processor for control of digital communication networks, with 2186 bytes of RAM will be discussed. The chip features include instruction fault detection, I/O parity check/ generation and special test modes.