用于测试混合信号集成电路的自动合成测试电路板电路

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI:10.1109/VTEST.1993.313319

W. Kao, J. Xia

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引用次数: 8

摘要

测试开发无疑是混合信号集成电路产品交付周期的主要瓶颈。测试开发阶段最耗时的任务之一是DUT板的设计，其中将插入IC以在混合信号测试仪上运行。本文介绍了一种通过测试模块原理图捕获集成电路测试信息的新方法，然后使用自动工具合成用于混合信号ATEs的最终负载板电路

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Automatic synthesis of DUT board circuits for testing of mixed signal ICs

Test development is without doubt the major bottleneck in the product delivery cycle of mixed signal ICs. One of the most time consuming tasks during the test development phase is the design of the DUT board where the IC is to be inserted to run on a mixed signal tester. This paper describes a new methodology of capturing test information for an IC through test module schematics and then using an automatic tool to synthesize the final load board circuitry to be used on mixed signal ATEs.<>

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Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium

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