{"title":"屏蔽电缆表面传递阻抗测量误差分析","authors":"K. Sakthivel, S.K. Das, R. Ganesan","doi":"10.1109/ICEMIC.1999.871612","DOIUrl":null,"url":null,"abstract":"This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Error analysis in surface transfer impedance measurements on shielded cables\",\"authors\":\"K. Sakthivel, S.K. Das, R. Ganesan\",\"doi\":\"10.1109/ICEMIC.1999.871612\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.\",\"PeriodicalId\":104361,\"journal\":{\"name\":\"Proceedings of the International Conference on Electromagnetic Interference and Compatibility\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the International Conference on Electromagnetic Interference and Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEMIC.1999.871612\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMIC.1999.871612","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Error analysis in surface transfer impedance measurements on shielded cables
This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.
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