{"title":"模拟电路故障诊断中的公差最大化","authors":"L. Chruszczyk, D. Grzechca","doi":"10.1109/ECCTD.2011.6043817","DOIUrl":null,"url":null,"abstract":"This article presents maximisation of components tolerance together with finding optimal frequency of a periodic excitation in fault diagnosis of analogue electronic circuits. Addi-tionally classical two-stage “detection → location” diagnosis se-quence is merged into single step in order to reduce test time. Presented optimisation problems are solved by means of a ge-netic algorithm.","PeriodicalId":126960,"journal":{"name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Tolerance maximisation in fault diagnosis of analogue electronic circuits\",\"authors\":\"L. Chruszczyk, D. Grzechca\",\"doi\":\"10.1109/ECCTD.2011.6043817\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents maximisation of components tolerance together with finding optimal frequency of a periodic excitation in fault diagnosis of analogue electronic circuits. Addi-tionally classical two-stage “detection → location” diagnosis se-quence is merged into single step in order to reduce test time. Presented optimisation problems are solved by means of a ge-netic algorithm.\",\"PeriodicalId\":126960,\"journal\":{\"name\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 20th European Conference on Circuit Theory and Design (ECCTD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2011.6043817\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2011.6043817","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Tolerance maximisation in fault diagnosis of analogue electronic circuits
This article presents maximisation of components tolerance together with finding optimal frequency of a periodic excitation in fault diagnosis of analogue electronic circuits. Addi-tionally classical two-stage “detection → location” diagnosis se-quence is merged into single step in order to reduce test time. Presented optimisation problems are solved by means of a ge-netic algorithm.