射频压控振荡器的BIST方案，允许切割的自校正

2009 International Test Conference Pub Date : 2009-12-18 DOI:10.1109/TEST.2009.5355721

L. Testa, H. Lapuyade, Y. Deval, O. Mazouffre, J. Carbonéro, J. Bégueret

{"title":"射频压控振荡器的BIST方案，允许切割的自校正","authors":"L. Testa, H. Lapuyade, Y. Deval, O. Mazouffre, J. Carbonéro, J. Bégueret","doi":"10.1109/TEST.2009.5355721","DOIUrl":null,"url":null,"abstract":"In order to implement a Built-In Self-Test (BIST) strategy for a Radio Frequency (RF) LC-Voltage Controlled Oscillator (VCO) devoted to Wimax applications, an exhaustive study of the fault coverage achievable for this block is carried out. The peak-to-peak value of the output voltage is shown to be the best quantity to monitor. Once the fault is detected, it is shown that the BIST can be exploited as well to trigger a feedback allowing, in some cases, the self-correction of the VCO. The complete system is designed using the STM CMOS 65nm process.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"BIST scheme for RF VCOs allowing the self-correction of the cut\",\"authors\":\"L. Testa, H. Lapuyade, Y. Deval, O. Mazouffre, J. Carbonéro, J. Bégueret\",\"doi\":\"10.1109/TEST.2009.5355721\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to implement a Built-In Self-Test (BIST) strategy for a Radio Frequency (RF) LC-Voltage Controlled Oscillator (VCO) devoted to Wimax applications, an exhaustive study of the fault coverage achievable for this block is carried out. The peak-to-peak value of the output voltage is shown to be the best quantity to monitor. Once the fault is detected, it is shown that the BIST can be exploited as well to trigger a feedback allowing, in some cases, the self-correction of the VCO. The complete system is designed using the STM CMOS 65nm process.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355721\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355721","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

为了实现用于Wimax应用的射频(RF) lc压控振荡器(VCO)的内置自检(BIST)策略，对该块可实现的故障覆盖进行了详尽的研究。输出电压的峰对峰值显示为监测的最佳量。一旦检测到故障，就表明可以利用BIST来触发反馈，在某些情况下，允许VCO的自我校正。整个系统采用STM CMOS 65nm工艺设计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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BIST scheme for RF VCOs allowing the self-correction of the cut

In order to implement a Built-In Self-Test (BIST) strategy for a Radio Frequency (RF) LC-Voltage Controlled Oscillator (VCO) devoted to Wimax applications, an exhaustive study of the fault coverage achievable for this block is carried out. The peak-to-peak value of the output voltage is shown to be the best quantity to monitor. Once the fault is detected, it is shown that the BIST can be exploited as well to trigger a feedback allowing, in some cases, the self-correction of the VCO. The complete system is designed using the STM CMOS 65nm process.

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2009 International Test Conference

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