一个100ps双极逻辑

T. Sakai, Y. Sunohara, H. Nakamura, T. Sudo
{"title":"一个100ps双极逻辑","authors":"T. Sakai, Y. Sunohara, H. Nakamura, T. Sudo","doi":"10.1109/ISSCC.1977.1155640","DOIUrl":null,"url":null,"abstract":"AN ULTRA HIGH-SPEED bipolar integrated circuit has been developed with a propagation delay time of less than 100 ps. The process technologies involved are Elevated Electrode IC, an advanced version of SET’. The integrated transistor structure is shown in Figure 1. Arsenic doped polycrystalline silicon is used for the diffusion source as well as the elevated electrodes, emitter and collector, and also interconnection between devices. The polycrystalline silicon is processed to form an overhanging edge. In the subsequent metal evaporation process, the shadowed area under the overhanging edge functions to separate the polycrystalline silicon from the lower level, consequently the evaporated metals are isolated from another by the overhanging edge and the formation of all electrodes and interconnections is completed without the use of fine photolithography and etching processes. After the evaporation of metal on the entire surface of the circuit, the unnecessary portions are etched out by the conventional process, without precise mask alignment. The second metalization step can be made in the conventional way.","PeriodicalId":416313,"journal":{"name":"1977 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A 100 PS bipolar logic\",\"authors\":\"T. Sakai, Y. Sunohara, H. Nakamura, T. Sudo\",\"doi\":\"10.1109/ISSCC.1977.1155640\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"AN ULTRA HIGH-SPEED bipolar integrated circuit has been developed with a propagation delay time of less than 100 ps. The process technologies involved are Elevated Electrode IC, an advanced version of SET’. The integrated transistor structure is shown in Figure 1. Arsenic doped polycrystalline silicon is used for the diffusion source as well as the elevated electrodes, emitter and collector, and also interconnection between devices. The polycrystalline silicon is processed to form an overhanging edge. In the subsequent metal evaporation process, the shadowed area under the overhanging edge functions to separate the polycrystalline silicon from the lower level, consequently the evaporated metals are isolated from another by the overhanging edge and the formation of all electrodes and interconnections is completed without the use of fine photolithography and etching processes. After the evaporation of metal on the entire surface of the circuit, the unnecessary portions are etched out by the conventional process, without precise mask alignment. The second metalization step can be made in the conventional way.\",\"PeriodicalId\":416313,\"journal\":{\"name\":\"1977 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1977 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1977.1155640\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1977 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1977.1155640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

超高速双极集成电路已被开发,其传播延迟时间小于100 ps。所涉及的工艺技术是一种高级版本的高电极集成电路。集成晶体管结构如图1所示。砷掺杂多晶硅不仅用作扩散源,还用作高架电极、发射极和集电极,以及器件之间的互连。多晶硅被加工成形成悬边。在随后的金属蒸发过程中,悬垂边下的阴影区域将多晶硅与下层分离,因此蒸发的金属被悬垂边隔离开来,所有电极和互连的形成都无需使用精细的光刻和蚀刻工艺。在整个电路表面的金属蒸发后,不需要的部分通过传统工艺蚀刻出来,没有精确的掩模对准。第二步金属化可按常规方法进行。
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A 100 PS bipolar logic
AN ULTRA HIGH-SPEED bipolar integrated circuit has been developed with a propagation delay time of less than 100 ps. The process technologies involved are Elevated Electrode IC, an advanced version of SET’. The integrated transistor structure is shown in Figure 1. Arsenic doped polycrystalline silicon is used for the diffusion source as well as the elevated electrodes, emitter and collector, and also interconnection between devices. The polycrystalline silicon is processed to form an overhanging edge. In the subsequent metal evaporation process, the shadowed area under the overhanging edge functions to separate the polycrystalline silicon from the lower level, consequently the evaporated metals are isolated from another by the overhanging edge and the formation of all electrodes and interconnections is completed without the use of fine photolithography and etching processes. After the evaporation of metal on the entire surface of the circuit, the unnecessary portions are etched out by the conventional process, without precise mask alignment. The second metalization step can be made in the conventional way.
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