Boyon Kim, Il-Chan Park, G. Song, Wooseong Choi, Byeong-Yun Kim, Kyu-Hoon Lee, Chi-young Choi
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A novel multisite testing techniques by using frequency synthesizer
Same output frequencies at each DUT of the testing circuit are multiplied by different LO frequencies signals at mixers stages, which different frequency-translated spectrums were captured at capture port simultaneously for achieving fully parallel test of RF device.