半导体器件仿真的等效电路方法

T.K.P. Wong, P.C.H. Chan
{"title":"半导体器件仿真的等效电路方法","authors":"T.K.P. Wong, P.C.H. Chan","doi":"10.1109/HKEDM.1994.395139","DOIUrl":null,"url":null,"abstract":"The development of a simulation program based on the equivalent circuit model approach and using symbolic manipulation tools was presented. We have shown that the result from simulation program can be verified with simple analytical expressions. We have also shown that this approach is general in a sense that any arbitrary impurity and recombination center profiles can be used. In this approach, the device is converted to an equivalent circuit. We expect this approach to be useful for mixed circuit and device simulation. Although we have only present the result for DC analysis, the result can easily be extended to transient and small-signal analysis.<<ETX>>","PeriodicalId":206109,"journal":{"name":"1994 IEEE Hong Kong Electron Devices Meeting","volume":"31 4","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An equivalent circuit approach to semiconductor device simulation\",\"authors\":\"T.K.P. Wong, P.C.H. Chan\",\"doi\":\"10.1109/HKEDM.1994.395139\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development of a simulation program based on the equivalent circuit model approach and using symbolic manipulation tools was presented. We have shown that the result from simulation program can be verified with simple analytical expressions. We have also shown that this approach is general in a sense that any arbitrary impurity and recombination center profiles can be used. In this approach, the device is converted to an equivalent circuit. We expect this approach to be useful for mixed circuit and device simulation. Although we have only present the result for DC analysis, the result can easily be extended to transient and small-signal analysis.<<ETX>>\",\"PeriodicalId\":206109,\"journal\":{\"name\":\"1994 IEEE Hong Kong Electron Devices Meeting\",\"volume\":\"31 4\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1994 IEEE Hong Kong Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HKEDM.1994.395139\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1994 IEEE Hong Kong Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HKEDM.1994.395139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

介绍了基于等效电路模型方法和使用符号操作工具的仿真程序的开发。我们已经证明,仿真程序的结果可以用简单的解析表达式来验证。我们还表明,这种方法在某种意义上是通用的,任何任意杂质和复合中心轮廓都可以使用。在这种方法中,器件被转换成等效电路。我们期望这种方法对混合电路和器件仿真有用。虽然我们只给出了直流分析的结果,但结果可以很容易地扩展到瞬态和小信号分析
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
An equivalent circuit approach to semiconductor device simulation
The development of a simulation program based on the equivalent circuit model approach and using symbolic manipulation tools was presented. We have shown that the result from simulation program can be verified with simple analytical expressions. We have also shown that this approach is general in a sense that any arbitrary impurity and recombination center profiles can be used. In this approach, the device is converted to an equivalent circuit. We expect this approach to be useful for mixed circuit and device simulation. Although we have only present the result for DC analysis, the result can easily be extended to transient and small-signal analysis.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A process scheme chosen for BiCMOS circuit Calculation of I-V curves of a GaAs MESFET with nonuniform channel doping by means of numerical integration Electrical performance and reliability of n-MOSFET's with gate dielectrics fabricated by different techniques Design and fabrication of micro-hotplate for thin film gas sensor A methodology for converting polygon based standard cell from bulk CMOS to SOI
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1