设计技术挑战系统和芯片级设计在非常深的亚微米技术

James Lin
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引用次数: 1

摘要

随着深亚微米制程技术的发展,以前可以忽略的现象现在对集成电路设计的稳健性有很大的影响。同时,更小的特征尺寸也使得芯片上可用的功能数量(或晶体管数量)呈指数增长。工艺技术和设计的复杂性正在扩大设计技术的差距,如果不能妥善解决,将威胁到工艺规模的延续和行业从中受益的能力。本演讲将讨论工艺和设计技术的复杂性及其对新设计、新产品开发和未来解决方案的影响。
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Design technology challenges for system and chip level designs in very deep submicron technologies
With very deep submicron process technologies, previously ignorable phenomena now have great impact on the robustness of IC designs. At the same time, the smaller feature sizes also enable an exponential increase in number of functions (or transistor count) available on chip. Complexity in process technology and design is widening the Design Technology gap, which, if not addressed properly, will threaten the continuation of process scaling and the industry's ability to benefit from it. The complexity of process and design technology, its impact on new designs, new products development and future solutions will be discussed in this presentation.
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