{"title":"倒装晶圆对晶圆键合回顾:与大批量生产的差距","authors":"Mario Di Cino, Feng Li","doi":"10.30564/ssid.v4i1.4474","DOIUrl":null,"url":null,"abstract":"Flip chip die-to-wafer bonding faces challenges for industry adoption due to a variety of technical gaps or process integration factors that are not fully developed to high volume manufacturing (HVM) maturity. In this paper,flip-chip and wire bonding are compared, then flip-chip bonding techniques are compared to examine advantages for scaling and speed. Specific recent 3-year trends in flip-chip die-to-wafer bonding are reviewed to address the key gaps and challenges to HVM adoption. Finally, some thoughts on the care needed by the packaging technology for successful HVM introduction are reviewed.","PeriodicalId":315789,"journal":{"name":"Semiconductor Science and Information Devices","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Flip Chip Die-to-Wafer Bonding Review: Gaps to High Volume Manufacturing\",\"authors\":\"Mario Di Cino, Feng Li\",\"doi\":\"10.30564/ssid.v4i1.4474\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Flip chip die-to-wafer bonding faces challenges for industry adoption due to a variety of technical gaps or process integration factors that are not fully developed to high volume manufacturing (HVM) maturity. In this paper,flip-chip and wire bonding are compared, then flip-chip bonding techniques are compared to examine advantages for scaling and speed. Specific recent 3-year trends in flip-chip die-to-wafer bonding are reviewed to address the key gaps and challenges to HVM adoption. Finally, some thoughts on the care needed by the packaging technology for successful HVM introduction are reviewed.\",\"PeriodicalId\":315789,\"journal\":{\"name\":\"Semiconductor Science and Information Devices\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Semiconductor Science and Information Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.30564/ssid.v4i1.4474\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Semiconductor Science and Information Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.30564/ssid.v4i1.4474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Flip Chip Die-to-Wafer Bonding Review: Gaps to High Volume Manufacturing
Flip chip die-to-wafer bonding faces challenges for industry adoption due to a variety of technical gaps or process integration factors that are not fully developed to high volume manufacturing (HVM) maturity. In this paper,flip-chip and wire bonding are compared, then flip-chip bonding techniques are compared to examine advantages for scaling and speed. Specific recent 3-year trends in flip-chip die-to-wafer bonding are reviewed to address the key gaps and challenges to HVM adoption. Finally, some thoughts on the care needed by the packaging technology for successful HVM introduction are reviewed.