倒装晶圆对晶圆键合回顾:与大批量生产的差距

Mario Di Cino, Feng Li
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引用次数: 0

摘要

由于各种技术差距或工艺集成因素尚未完全发展到大批量生产(HVM)成熟度,倒装芯片芯片到晶圆键合在行业采用方面面临挑战。本文比较了倒装芯片和线键合技术,然后比较了倒装芯片键合技术在规模和速度方面的优势。回顾了倒装芯片芯片到晶圆键合最近3年的具体趋势,以解决HVM采用的关键差距和挑战。最后,对成功引进HVM的封装技术需要注意的一些问题进行了综述。
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Flip Chip Die-to-Wafer Bonding Review: Gaps to High Volume Manufacturing
Flip chip die-to-wafer bonding faces challenges for industry adoption due to a variety of technical gaps or process integration factors that are not fully developed to high volume manufacturing (HVM) maturity. In this paper,flip-chip and wire bonding are compared, then flip-chip bonding techniques are compared to examine advantages for scaling and speed. Specific recent 3-year trends in flip-chip die-to-wafer bonding are reviewed to address the key gaps and challenges to HVM adoption. Finally, some thoughts on the care needed by the packaging technology for successful HVM introduction are reviewed.
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