VSPA对接焊点的二维和三维建模

R. Murphy, S. Sitaraman
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引用次数: 1

摘要

本文的目的是建立一种新型外设阵列封装VSPA的二维和三维数值模型,并研究其焊点可靠性。VSPA在其外围有多排对接型引线,表面安装在标准的FR-4印刷电路板上。FR-4和各种封装材料被建模为温度相关的弹性材料,而共晶焊料被建模为温度相关的弹塑性材料。在假设组件在室温下无应力的情况下,封装和电路板组件承受85/spl度/C的温升(/spl δ /T)。将三维1/8截面模型的计算结果与二维平面应变、平面应力模型以及三维“条形”模型进行了比较。
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Two and three-dimensional modeling of VSPA butt solder joints
The objective of this work is to develop two- and three-dimensional numerical models of VSPA, a new peripheral array package, and study its solder joint reliability. VSPA has multiple rows of butt-type leads around its periphery and is surface mounted on a standard FR-4 printed circuit board. The FR-4 and various package materials were modeled as temperature-dependent and elastic while the eutectic solder was modeled as temperature-dependent, elastic-plastic. The package and board assembly were subjected to a temperature increase (/spl Delta/T) of 85/spl deg/C with the assumption that the assembly is stress-free at room temperature. The results obtained from a three-dimensional 1/8th section model are compared with the results from 2-D plane-strain and plane-stress models and with 3-D "strip" models.
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