{"title":"加快模拟故障仿真的建议","authors":"W. Vermeiren, B. Straube, G. Elst","doi":"10.1109/EDTC.1994.326961","DOIUrl":null,"url":null,"abstract":"On the assumption that a commercial analog simulation tool is used an accelerated analog fault simulation can be carried out by simultaneous simulations of several faulty networks using external user written programs. If clusters with faults having similar sensitivity and temporal effects to the output can be constructed and when the faults of each cluster are simulated simultaneously a further speed-up can be achieved.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A suggestion for accelerating the analog fault simulation\",\"authors\":\"W. Vermeiren, B. Straube, G. Elst\",\"doi\":\"10.1109/EDTC.1994.326961\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On the assumption that a commercial analog simulation tool is used an accelerated analog fault simulation can be carried out by simultaneous simulations of several faulty networks using external user written programs. If clusters with faults having similar sensitivity and temporal effects to the output can be constructed and when the faults of each cluster are simulated simultaneously a further speed-up can be achieved.<<ETX>>\",\"PeriodicalId\":244297,\"journal\":{\"name\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1994.326961\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326961","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A suggestion for accelerating the analog fault simulation
On the assumption that a commercial analog simulation tool is used an accelerated analog fault simulation can be carried out by simultaneous simulations of several faulty networks using external user written programs. If clusters with faults having similar sensitivity and temporal effects to the output can be constructed and when the faults of each cluster are simulated simultaneously a further speed-up can be achieved.<>
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