{"title":"实现IEEE1641和ATML的TPS集成开发环境","authors":"Qiao Liyan, Zhao-Lin Liu, Pengpeng Yu, Peng Xiyuan","doi":"10.1109/AUTEST.2009.5314048","DOIUrl":null,"url":null,"abstract":"With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A TPS Integrated Development Environment implementing IEEE1641 and ATML\",\"authors\":\"Qiao Liyan, Zhao-Lin Liu, Pengpeng Yu, Peng Xiyuan\",\"doi\":\"10.1109/AUTEST.2009.5314048\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.\",\"PeriodicalId\":187421,\"journal\":{\"name\":\"2009 IEEE AUTOTESTCON\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2009.5314048\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314048","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A TPS Integrated Development Environment implementing IEEE1641 and ATML
With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.