K. Kawakami, T. Shiro, Hironobu Yamasaki, K. Yoda, Hiroaki Fujimoto, K. Kawasaki, Yasuhiro Watanabe
{"title":"采用65nm深度耗尽通道晶体管制造的传感器网络处理器的峰值功耗降低","authors":"K. Kawakami, T. Shiro, Hironobu Yamasaki, K. Yoda, Hiroaki Fujimoto, K. Kawasaki, Yasuhiro Watanabe","doi":"10.1109/ISQED.2013.6523646","DOIUrl":null,"url":null,"abstract":"We fabricated a low power sensor network processor with Deeply Depleted Channel (DDC) transistors of 65 nm technology, which has distinguishing device structure and enables variation of threshold voltage (Vth) of transistors to decrease. At the optimal voltage condition to achieve the same maximum operating frequency, measurement result shows that the DDC process achieves a 47.0 % of peak power reduction for the micro controller unit (MCU) compared to the conventional low power (LP) process. Measurement result also shows the DDC process improves 56.5 % and 15.0 % of operating frequency, 200 mV and 50 mV of supply voltage margin, or 23.8 % and 19.0 % of power reduction for the MCU and 320 KB SRAM, respectively, even if the Vth of the LP process is adjusted to that of the DDC process. The paper has also discussed the optimal voltage control method, which is suitable for the various applications of sensor network processors.","PeriodicalId":127115,"journal":{"name":"International Symposium on Quality Electronic Design (ISQED)","volume":"112 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Peak power reduction of a sensor network processor fabricated with Deeply Depleted Channel transistors in 65nm technology\",\"authors\":\"K. Kawakami, T. Shiro, Hironobu Yamasaki, K. Yoda, Hiroaki Fujimoto, K. Kawasaki, Yasuhiro Watanabe\",\"doi\":\"10.1109/ISQED.2013.6523646\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We fabricated a low power sensor network processor with Deeply Depleted Channel (DDC) transistors of 65 nm technology, which has distinguishing device structure and enables variation of threshold voltage (Vth) of transistors to decrease. At the optimal voltage condition to achieve the same maximum operating frequency, measurement result shows that the DDC process achieves a 47.0 % of peak power reduction for the micro controller unit (MCU) compared to the conventional low power (LP) process. Measurement result also shows the DDC process improves 56.5 % and 15.0 % of operating frequency, 200 mV and 50 mV of supply voltage margin, or 23.8 % and 19.0 % of power reduction for the MCU and 320 KB SRAM, respectively, even if the Vth of the LP process is adjusted to that of the DDC process. The paper has also discussed the optimal voltage control method, which is suitable for the various applications of sensor network processors.\",\"PeriodicalId\":127115,\"journal\":{\"name\":\"International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"112 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-03-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2013.6523646\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2013.6523646","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Peak power reduction of a sensor network processor fabricated with Deeply Depleted Channel transistors in 65nm technology
We fabricated a low power sensor network processor with Deeply Depleted Channel (DDC) transistors of 65 nm technology, which has distinguishing device structure and enables variation of threshold voltage (Vth) of transistors to decrease. At the optimal voltage condition to achieve the same maximum operating frequency, measurement result shows that the DDC process achieves a 47.0 % of peak power reduction for the micro controller unit (MCU) compared to the conventional low power (LP) process. Measurement result also shows the DDC process improves 56.5 % and 15.0 % of operating frequency, 200 mV and 50 mV of supply voltage margin, or 23.8 % and 19.0 % of power reduction for the MCU and 320 KB SRAM, respectively, even if the Vth of the LP process is adjusted to that of the DDC process. The paper has also discussed the optimal voltage control method, which is suitable for the various applications of sensor network processors.