{"title":"兼容EMC的LIN收发器","authors":"P. Schröter, Magnus-Maria Hell, Martin Frey","doi":"10.1109/ESSCIRC.2013.6649148","DOIUrl":null,"url":null,"abstract":"This paper introduces an integrated Local Interconnect Network (LIN) transceiver which sets a new performance benchmark in terms of electromagnetic compatibility (EMC). The proposed topology succeeds in an extraordinary high robustness against RF disturbances which are injected into the BUS and in very low electromagnetic emissions (EMEs) radiated by the LIN network without adding any external components for filtering. In order to evaluate the circuits superior EMC performance, it was designed using a HV-BiCMOS technology for automotive applications, the EMC behavior was measured and the results were compared with a state of the art topology.","PeriodicalId":183620,"journal":{"name":"2013 Proceedings of the ESSCIRC (ESSCIRC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"EMC compliant LIN transceiver\",\"authors\":\"P. Schröter, Magnus-Maria Hell, Martin Frey\",\"doi\":\"10.1109/ESSCIRC.2013.6649148\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces an integrated Local Interconnect Network (LIN) transceiver which sets a new performance benchmark in terms of electromagnetic compatibility (EMC). The proposed topology succeeds in an extraordinary high robustness against RF disturbances which are injected into the BUS and in very low electromagnetic emissions (EMEs) radiated by the LIN network without adding any external components for filtering. In order to evaluate the circuits superior EMC performance, it was designed using a HV-BiCMOS technology for automotive applications, the EMC behavior was measured and the results were compared with a state of the art topology.\",\"PeriodicalId\":183620,\"journal\":{\"name\":\"2013 Proceedings of the ESSCIRC (ESSCIRC)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 Proceedings of the ESSCIRC (ESSCIRC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.2013.6649148\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Proceedings of the ESSCIRC (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.2013.6649148","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper introduces an integrated Local Interconnect Network (LIN) transceiver which sets a new performance benchmark in terms of electromagnetic compatibility (EMC). The proposed topology succeeds in an extraordinary high robustness against RF disturbances which are injected into the BUS and in very low electromagnetic emissions (EMEs) radiated by the LIN network without adding any external components for filtering. In order to evaluate the circuits superior EMC performance, it was designed using a HV-BiCMOS technology for automotive applications, the EMC behavior was measured and the results were compared with a state of the art topology.