耦合M/NEMS谐振器的反特征值分析技术

Guowei Tao, B. Choubey
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引用次数: 2

摘要

M/NEMS谐振器被广泛用于质量传感器。耦合谐振器已成为多功能传感的一个有前途的候选者,同时减少了互连和焊盘的数量。这些传感器之间的耦合可以通过驱动/读取一个元件来控制和表征整个阵列。逆特征值分析利用单谐振器响应记录的特征值对所有谐振器的系统矩阵进行逆重构。我们比较了两种反特征值分析技术来表征耦合M/NEMS谐振器。第一种技术是扰动一个元件的弹簧常数,而第二种技术是在阵列上附加一个谐振器。这两种方法在提取模拟谐振器阵列的实际特性时都显示出较高的准确性。然而,当研究在噪声情况下的性能时,第二种方法显示出更好的准确性。此外,第二种技术通过使用简单的电谐振器更容易实现。反特征值分析可用于驱动单输入单输出多功能传感器和监测微纳制造变化。
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Inverse eigenvalue analysis techniques for coupled M/NEMS resonators
M/NEMS resonators are widely used as mass sensors. Coupled resonators have emerged as a promising candidate for multifunction sensing while reducing the number of interconnections and pads. Coupling between these sensors enables control and characterization of the entire array by driving/reading from only one element. Inverse eigenvalue analysis utilizes the eigenvalues recorded from the response of one single resonator to inversely reconstruct the system matrix of all resonators. We compare two inverse eigenvalue analysis techniques to characterize coupled M/NEMS resonators. The first technique perturbs the spring constant of one element, while the second couples an additional resonator to the array. Both techniques showed high accuracy in extracting the actual characteristics of a simulated array of resonators. However, when studied for performance in noisy situation, the second technique shows better accuracy. Furthermore, the second technique is easier to implement by using a simple electrical resonator. Inverse eigenvalue analysis can be used to actuate single input single output multifunction sensors and monitor micro/nano fabrication variabilities.
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