基于robdd的可重构单电子晶体管阵列面积最小化合成

Yi-Hang Chen, Yang-Wen Chen, Juinn-Dar Huang
{"title":"基于robdd的可重构单电子晶体管阵列面积最小化合成","authors":"Yi-Hang Chen, Yang-Wen Chen, Juinn-Dar Huang","doi":"10.1109/VLSI-DAT.2015.7114494","DOIUrl":null,"url":null,"abstract":"The power dissipation has become a crucial issue for most electronic circuit and system designs nowadays when fabrication processes exploit even deeper submicron technology. In particular, leakage power is becoming a dominant source of power consumption. In recent years, the reconfigurable single-electron transistor (SET) array has been proposed as an emerging circuit design style for continuing Moore's Law due to its ultra-low power consumption. Several automated synthesis techniques for area minimization have been developed for the reconfigurable SET array in the past few years. Nevertheless, most of those existing methods focus on variable and product term reordering during SET mapping. In fact, minimizing the number of product terms can greatly reduce the area as well, which has not been well addressed before. In this paper, we propose a dynamic shifting based variable ordering algorithm that can minimize the number of disjoint sum-of-product terms extracted from the given ROBDD. Experimental results show that the proposed method can achieve an area reduction of up to 49% as compared to current state-of-the-art techniques.","PeriodicalId":369130,"journal":{"name":"VLSI Design, Automation and Test(VLSI-DAT)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"ROBDD-based area minimization synthesis for reconfigurable single-electron transistor arrays\",\"authors\":\"Yi-Hang Chen, Yang-Wen Chen, Juinn-Dar Huang\",\"doi\":\"10.1109/VLSI-DAT.2015.7114494\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The power dissipation has become a crucial issue for most electronic circuit and system designs nowadays when fabrication processes exploit even deeper submicron technology. In particular, leakage power is becoming a dominant source of power consumption. In recent years, the reconfigurable single-electron transistor (SET) array has been proposed as an emerging circuit design style for continuing Moore's Law due to its ultra-low power consumption. Several automated synthesis techniques for area minimization have been developed for the reconfigurable SET array in the past few years. Nevertheless, most of those existing methods focus on variable and product term reordering during SET mapping. In fact, minimizing the number of product terms can greatly reduce the area as well, which has not been well addressed before. In this paper, we propose a dynamic shifting based variable ordering algorithm that can minimize the number of disjoint sum-of-product terms extracted from the given ROBDD. Experimental results show that the proposed method can achieve an area reduction of up to 49% as compared to current state-of-the-art techniques.\",\"PeriodicalId\":369130,\"journal\":{\"name\":\"VLSI Design, Automation and Test(VLSI-DAT)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"VLSI Design, Automation and Test(VLSI-DAT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSI-DAT.2015.7114494\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design, Automation and Test(VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2015.7114494","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

当制造工艺采用更深层次的亚微米技术时,功耗已成为大多数电子电路和系统设计的关键问题。特别是,泄漏功率正在成为电力消耗的主要来源。近年来,可重构单电子晶体管(SET)阵列因其超低功耗而被提出作为一种延续摩尔定律的新兴电路设计风格。近年来,针对可重构SET阵列开发了几种面积最小化的自动合成技术。然而,现有的方法大多侧重于SET映射过程中变量和产品项的重新排序。事实上,减少产品术语的数量也可以大大减少面积,这是以前没有很好地解决的问题。在本文中,我们提出了一种基于动态移位的变量排序算法,该算法可以最大限度地减少从给定的ROBDD中提取的不相交积和项的数量。实验结果表明,与目前最先进的技术相比,该方法可以实现高达49%的面积缩小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
ROBDD-based area minimization synthesis for reconfigurable single-electron transistor arrays
The power dissipation has become a crucial issue for most electronic circuit and system designs nowadays when fabrication processes exploit even deeper submicron technology. In particular, leakage power is becoming a dominant source of power consumption. In recent years, the reconfigurable single-electron transistor (SET) array has been proposed as an emerging circuit design style for continuing Moore's Law due to its ultra-low power consumption. Several automated synthesis techniques for area minimization have been developed for the reconfigurable SET array in the past few years. Nevertheless, most of those existing methods focus on variable and product term reordering during SET mapping. In fact, minimizing the number of product terms can greatly reduce the area as well, which has not been well addressed before. In this paper, we propose a dynamic shifting based variable ordering algorithm that can minimize the number of disjoint sum-of-product terms extracted from the given ROBDD. Experimental results show that the proposed method can achieve an area reduction of up to 49% as compared to current state-of-the-art techniques.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A 127 fJ/conv. continuous-time delta-sigma modulator with a DWA-embedded two-step time-domain quantizer Biomedical devices and instruments for point-of-care diagnosis Cost challenges on the way to the Internet of Things An in-pixel equalizer with kTC noise cancellation and FPN reduction for time-of-flight CMOS image sensor A dual-edge sampling CES delay-locked loop based clock and data recovery circuits
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1