{"title":"通过后处理提高免疫图的空间分辨率","authors":"A. Boyer","doi":"10.1109/APEMC.2016.7522794","DOIUrl":null,"url":null,"abstract":"Near-field injection is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances. A major requirement is the spatial resolution of the immunity map. This paper aims at proposing a post-processing method to enhance the spatial resolution of immunity map and validating it on case studies at board and integrated circuit levels.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"39 7","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Improving spatial resolution of immunity maps by post-processing\",\"authors\":\"A. Boyer\",\"doi\":\"10.1109/APEMC.2016.7522794\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Near-field injection is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances. A major requirement is the spatial resolution of the immunity map. This paper aims at proposing a post-processing method to enhance the spatial resolution of immunity map and validating it on case studies at board and integrated circuit levels.\",\"PeriodicalId\":358257,\"journal\":{\"name\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"volume\":\"39 7\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2016.7522794\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2016.7522794","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improving spatial resolution of immunity maps by post-processing
Near-field injection is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances. A major requirement is the spatial resolution of the immunity map. This paper aims at proposing a post-processing method to enhance the spatial resolution of immunity map and validating it on case studies at board and integrated circuit levels.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
