氮化镓场发射极阵列的温度效应

Ranajoy Bhattacharyar, Pao-Chuan Shih, Tomás Palacios, J. Browning
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引用次数: 0

摘要

氮化镓(GaN)场发射极阵列正被研究用于真空通道晶体管(vct)。本文对150×150 GaN场致发射体阵列进行了400℃热处理前后的表征,集电极电压保持在200V DC,栅极电压从0扫频到75V。从I-V测量中,在几次电压扫描后观察到发射电流的跳跃,这是一种调节形式,导致稳定的发射电流。在400℃下热处理10分钟后,观察到电流增加了约4倍,在75 V下达到最大场发射电流约10 μA。
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Temperature Effects on Gallium Nitride Field Emitter Arrays
Gallium nitride (GaN) field emitter arrays are being studied for use as vacuum channel transistors (VCTs). In this work, arrays of 150×150 GaN field emitters were characterized before and after heat treatment at 400° C. Collector voltage was kept at 200V DC, and the gate voltage was swept from 0 to 75V. From the I-V measurements, a jump in emission current, a form of conditioning, was observed after a few voltage sweeps resulting in a stable emission current. After heat treatment at 400° C for 10 minutes, ≈ 4 times increase in current was observed, reaching a maximum field emission current of ≈ 10 μA, at 75 V.
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