用旋转操作数重计算alu并发错误检测

J. Li, E. Swartzlander
{"title":"用旋转操作数重计算alu并发错误检测","authors":"J. Li, E. Swartzlander","doi":"10.1109/DFTVS.1992.224374","DOIUrl":null,"url":null,"abstract":"Analyzes concurrent error detection in arithmetic logic units by recomputing with rotated operands by k bits (RERO-k). Even though RERO-k was suggested as an extension of recomputation with shifted operands by k bits (RESO-k), the RERO implementation for arithmetic operations and its application to carry lookahead adders have not been shown. It is claimed that complex control units should be used to make RERO feasible. This control hardware may add additional faults which are different from the bit-slice faults in the ALU. In this approach, by adding only one spare bit slice in the arithmetic logic unit, RERO is possible for error detection of logical and arithmetic operations in either ripple carry adders and carry lookahead adders without any additional hardware control unit. Proof will be given that RERO-k can detect (k mod n) consecutive errors in logical operations and (k mod (n+1)-1) consecutive errors in arithmetic operations, where n is the length of the original arithmetic logic unit. This demonstrates that RERO preserves all the error detection features of RESO. With less hardware, time redundancy and more flexibility for error detection, the approach makes RERO more appropriate for VLSI designs.<<ETX>>","PeriodicalId":319218,"journal":{"name":"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"41","resultStr":"{\"title\":\"Concurrent error detection in ALUs by recomputing with rotated operands\",\"authors\":\"J. Li, E. Swartzlander\",\"doi\":\"10.1109/DFTVS.1992.224374\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analyzes concurrent error detection in arithmetic logic units by recomputing with rotated operands by k bits (RERO-k). Even though RERO-k was suggested as an extension of recomputation with shifted operands by k bits (RESO-k), the RERO implementation for arithmetic operations and its application to carry lookahead adders have not been shown. It is claimed that complex control units should be used to make RERO feasible. This control hardware may add additional faults which are different from the bit-slice faults in the ALU. In this approach, by adding only one spare bit slice in the arithmetic logic unit, RERO is possible for error detection of logical and arithmetic operations in either ripple carry adders and carry lookahead adders without any additional hardware control unit. Proof will be given that RERO-k can detect (k mod n) consecutive errors in logical operations and (k mod (n+1)-1) consecutive errors in arithmetic operations, where n is the length of the original arithmetic logic unit. This demonstrates that RERO preserves all the error detection features of RESO. With less hardware, time redundancy and more flexibility for error detection, the approach makes RERO more appropriate for VLSI designs.<<ETX>>\",\"PeriodicalId\":319218,\"journal\":{\"name\":\"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"41\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1992.224374\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1992.224374","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 41

摘要

分析了在算术逻辑单元中通过k位旋转操作数重计算(RERO-k)的并发错误检测。尽管RERO-k被认为是对操作数移位k位的重计算的扩展(RESO-k),但RERO对算术运算的实现及其在前瞻加法上的应用并没有被展示。它声称,应该使用复杂的控制单元,使reo可行。这种控制硬件可能会增加与ALU中的位片故障不同的额外故障。在这种方法中,通过在算术逻辑单元中仅添加一个备用位片,RERO可以在不需要任何额外硬件控制单元的情况下对纹波进位加法器和进位前瞻加法器中的逻辑和算术操作进行错误检测。证明RERO-k可以检测出逻辑运算中的(k mod n)个连续错误和算术运算中的(k mod (n+1)-1)个连续错误,其中n为原算术逻辑单元的长度。这说明reo保留了RESO的所有错误检测特征。该方法具有更少的硬件,时间冗余和更灵活的错误检测,使RERO更适合VLSI设计。
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Concurrent error detection in ALUs by recomputing with rotated operands
Analyzes concurrent error detection in arithmetic logic units by recomputing with rotated operands by k bits (RERO-k). Even though RERO-k was suggested as an extension of recomputation with shifted operands by k bits (RESO-k), the RERO implementation for arithmetic operations and its application to carry lookahead adders have not been shown. It is claimed that complex control units should be used to make RERO feasible. This control hardware may add additional faults which are different from the bit-slice faults in the ALU. In this approach, by adding only one spare bit slice in the arithmetic logic unit, RERO is possible for error detection of logical and arithmetic operations in either ripple carry adders and carry lookahead adders without any additional hardware control unit. Proof will be given that RERO-k can detect (k mod n) consecutive errors in logical operations and (k mod (n+1)-1) consecutive errors in arithmetic operations, where n is the length of the original arithmetic logic unit. This demonstrates that RERO preserves all the error detection features of RESO. With less hardware, time redundancy and more flexibility for error detection, the approach makes RERO more appropriate for VLSI designs.<>
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