{"title":"截面参数的不确定性对共面波导宽带电性能的影响","authors":"J. Leinhos, U. Arz","doi":"10.1109/SPI.2007.4512202","DOIUrl":null,"url":null,"abstract":"We investigate the effect of uncertainties in the cross- sectional parameters of ungrounded coplanar waveguides (CPWs) on the characteristic impedance and the propagation constant. For our calculations, a quasi-TEM model is used that takes into consideration the effects of non-ideal conductors, substrate loss and finite metallization thickness. The propagation of uncertainties is studied with the aid of Monte Carlo (MC) simulations. The effect of different manufacturing technologies is exemplified by two typical microwave substrates (AF45 and AI2O3). Furthermore, the impact of the uncertainties in the input quantities is investigated in such a way that conclusions for the design of CPWs as well as for the requirements on the accuracy of material measurement methods can be drawn.","PeriodicalId":206352,"journal":{"name":"2007 IEEE Workshop on Signal Propagation on Interconnects","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Effect of uncertainties in the cross-sectional parameters on the wideband electrical properties of coplanar waveguides\",\"authors\":\"J. Leinhos, U. Arz\",\"doi\":\"10.1109/SPI.2007.4512202\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We investigate the effect of uncertainties in the cross- sectional parameters of ungrounded coplanar waveguides (CPWs) on the characteristic impedance and the propagation constant. For our calculations, a quasi-TEM model is used that takes into consideration the effects of non-ideal conductors, substrate loss and finite metallization thickness. The propagation of uncertainties is studied with the aid of Monte Carlo (MC) simulations. The effect of different manufacturing technologies is exemplified by two typical microwave substrates (AF45 and AI2O3). Furthermore, the impact of the uncertainties in the input quantities is investigated in such a way that conclusions for the design of CPWs as well as for the requirements on the accuracy of material measurement methods can be drawn.\",\"PeriodicalId\":206352,\"journal\":{\"name\":\"2007 IEEE Workshop on Signal Propagation on Interconnects\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Workshop on Signal Propagation on Interconnects\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPI.2007.4512202\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Workshop on Signal Propagation on Interconnects","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2007.4512202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effect of uncertainties in the cross-sectional parameters on the wideband electrical properties of coplanar waveguides
We investigate the effect of uncertainties in the cross- sectional parameters of ungrounded coplanar waveguides (CPWs) on the characteristic impedance and the propagation constant. For our calculations, a quasi-TEM model is used that takes into consideration the effects of non-ideal conductors, substrate loss and finite metallization thickness. The propagation of uncertainties is studied with the aid of Monte Carlo (MC) simulations. The effect of different manufacturing technologies is exemplified by two typical microwave substrates (AF45 and AI2O3). Furthermore, the impact of the uncertainties in the input quantities is investigated in such a way that conclusions for the design of CPWs as well as for the requirements on the accuracy of material measurement methods can be drawn.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
