M. Rodwell, R. Yu, M. Reddy, J. Pusl, S. Allen, M. Case, U. Bhattacharya
{"title":"用非线性传输线分析毫米波网络","authors":"M. Rodwell, R. Yu, M. Reddy, J. Pusl, S. Allen, M. Case, U. Bhattacharya","doi":"10.1109/CORNEL.1993.303061","DOIUrl":null,"url":null,"abstract":"We report systems for network measurements at millimeter-wave frequencies. Active probes are used for on-wafer measurements to approximately 150 GHz. The active probes incorporate monolithic GaAs mm-wave network analysis circuits (comprising a nonlinear transmission line stimulus signal generator and a directional sampling circuit) and low-loss, rugged quartz coplanar-waveguide probe tips. Wideband transmitter and receiver integrated circuits interfaced to frequency-independent antennas, are used for free-space transmission measurements to approximately 250 GHz.<<ETX>>","PeriodicalId":129440,"journal":{"name":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Millimeter-wave network analysis using nonlinear transmission lines\",\"authors\":\"M. Rodwell, R. Yu, M. Reddy, J. Pusl, S. Allen, M. Case, U. Bhattacharya\",\"doi\":\"10.1109/CORNEL.1993.303061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report systems for network measurements at millimeter-wave frequencies. Active probes are used for on-wafer measurements to approximately 150 GHz. The active probes incorporate monolithic GaAs mm-wave network analysis circuits (comprising a nonlinear transmission line stimulus signal generator and a directional sampling circuit) and low-loss, rugged quartz coplanar-waveguide probe tips. Wideband transmitter and receiver integrated circuits interfaced to frequency-independent antennas, are used for free-space transmission measurements to approximately 250 GHz.<<ETX>>\",\"PeriodicalId\":129440,\"journal\":{\"name\":\"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CORNEL.1993.303061\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1993.303061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Millimeter-wave network analysis using nonlinear transmission lines
We report systems for network measurements at millimeter-wave frequencies. Active probes are used for on-wafer measurements to approximately 150 GHz. The active probes incorporate monolithic GaAs mm-wave network analysis circuits (comprising a nonlinear transmission line stimulus signal generator and a directional sampling circuit) and low-loss, rugged quartz coplanar-waveguide probe tips. Wideband transmitter and receiver integrated circuits interfaced to frequency-independent antennas, are used for free-space transmission measurements to approximately 250 GHz.<>