复杂电路功能测试中考虑异步信号的方法

C. Bellon, R. Velazco
{"title":"复杂电路功能测试中考虑异步信号的方法","authors":"C. Bellon, R. Velazco","doi":"10.1109/DAC.1984.1585843","DOIUrl":null,"url":null,"abstract":"The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"64 8-9","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Taking into Account Asynchronous Signals in Functional Test of Complex Circuits\",\"authors\":\"C. Bellon, R. Velazco\",\"doi\":\"10.1109/DAC.1984.1585843\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.\",\"PeriodicalId\":188431,\"journal\":{\"name\":\"21st Design Automation Conference Proceedings\",\"volume\":\"64 8-9\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Design Automation Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1984.1585843\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

摘要

所提出的复杂电路功能测试方法具有以下特点:测试问题集中研究;提出了一种测试方法、测试环境和自动生成测试程序;电路行为被视为一个整体,包括对指令(或命令)的响应,以及对同一级别的信号的响应。重点是信号测试;定义了一种允许信号测试并与功能测试兼容的硬件;提出了一种信号时序图的描述语言。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Taking into Account Asynchronous Signals in Functional Test of Complex Circuits
The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
The Engineering Design Environment IGES as an Interchange Format for Integrated Circuit Design Functional Testing Techniques for Digital LSI/VLSI Systems Functional Design Verification by Multi-Level Simulation Uniform Support for Information Handling and Problem Solving Required by the VLSI Design Process
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1