A. Schroth, C. Lee, S. Matsumoto, M. Tanaka, R. Maeda
{"title":"溶胶-凝胶沉积PZT薄膜在驱动1D和2D扫描仪中的应用","authors":"A. Schroth, C. Lee, S. Matsumoto, M. Tanaka, R. Maeda","doi":"10.1109/MEMSYS.1998.659790","DOIUrl":null,"url":null,"abstract":"Despite to promising material properties, only few applications of thin (up to 5 /spl mu/m) piezoelectric PZT layers for actuation purpose of MEMS exist. To investigate actuation properties and application problems, this paper introduces the design, fabrication and characterization of 1D and 2D micro scanners actuated by a sol-gel deposited PZT layer of 1.5 /spl mu/m thickness. For the manufactured samples, measurements are carried out. After determining the relative dielectric constant of the PZT layer to about 1000 and its piezoelectric constant d/sub 31/ to 20...45 10/sup -12/ C/N, scanning angles were measured. For the ID scanner, angles between 11/spl deg/ and 35/spl deg/ could be determined, and for the 2D scanning structure 6.5/spl deg/ and 2.5/spl deg/ were observed for 10 V/sub pp/ maximum stimulation AC voltage. Deformation of the beams caused by technologically induced strain was found to change the behavior of the actuators. It can both, either decrease the device performance by increase of the mechanical compliance of the beam, or improve the performance by changing sinusoidal oscillation into a buckling-determined \"snapping\".","PeriodicalId":340972,"journal":{"name":"Proceedings MEMS 98. IEEE. Eleventh Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems (Cat. No.98CH36176","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":"{\"title\":\"Application of sol-gel deposited thin PZT film for actuation of 1D and 2D scanners\",\"authors\":\"A. Schroth, C. Lee, S. Matsumoto, M. Tanaka, R. Maeda\",\"doi\":\"10.1109/MEMSYS.1998.659790\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Despite to promising material properties, only few applications of thin (up to 5 /spl mu/m) piezoelectric PZT layers for actuation purpose of MEMS exist. To investigate actuation properties and application problems, this paper introduces the design, fabrication and characterization of 1D and 2D micro scanners actuated by a sol-gel deposited PZT layer of 1.5 /spl mu/m thickness. For the manufactured samples, measurements are carried out. After determining the relative dielectric constant of the PZT layer to about 1000 and its piezoelectric constant d/sub 31/ to 20...45 10/sup -12/ C/N, scanning angles were measured. For the ID scanner, angles between 11/spl deg/ and 35/spl deg/ could be determined, and for the 2D scanning structure 6.5/spl deg/ and 2.5/spl deg/ were observed for 10 V/sub pp/ maximum stimulation AC voltage. Deformation of the beams caused by technologically induced strain was found to change the behavior of the actuators. It can both, either decrease the device performance by increase of the mechanical compliance of the beam, or improve the performance by changing sinusoidal oscillation into a buckling-determined \\\"snapping\\\".\",\"PeriodicalId\":340972,\"journal\":{\"name\":\"Proceedings MEMS 98. IEEE. Eleventh Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems (Cat. No.98CH36176\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-01-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings MEMS 98. IEEE. Eleventh Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems (Cat. No.98CH36176\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMSYS.1998.659790\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings MEMS 98. IEEE. Eleventh Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems (Cat. No.98CH36176","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.1998.659790","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of sol-gel deposited thin PZT film for actuation of 1D and 2D scanners
Despite to promising material properties, only few applications of thin (up to 5 /spl mu/m) piezoelectric PZT layers for actuation purpose of MEMS exist. To investigate actuation properties and application problems, this paper introduces the design, fabrication and characterization of 1D and 2D micro scanners actuated by a sol-gel deposited PZT layer of 1.5 /spl mu/m thickness. For the manufactured samples, measurements are carried out. After determining the relative dielectric constant of the PZT layer to about 1000 and its piezoelectric constant d/sub 31/ to 20...45 10/sup -12/ C/N, scanning angles were measured. For the ID scanner, angles between 11/spl deg/ and 35/spl deg/ could be determined, and for the 2D scanning structure 6.5/spl deg/ and 2.5/spl deg/ were observed for 10 V/sub pp/ maximum stimulation AC voltage. Deformation of the beams caused by technologically induced strain was found to change the behavior of the actuators. It can both, either decrease the device performance by increase of the mechanical compliance of the beam, or improve the performance by changing sinusoidal oscillation into a buckling-determined "snapping".