Yuqi He, Mengkai Xi, Sihan Lv, Ge Zhao, Lu-yu Zhao
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Wide Beam Scanning Antenna Array and Near Field Testing System for 5G Millimeter-wave Communications
Millimeter-wave technology has attracted a lot of attention from academia and industry, while millimeter wave antenna arrays are utilized in both base stations and mobile terminals to confront the issues of high loss and channel blockage. In addition, since the space in the mobile terminal is extremely limited, there is an urgent need for a very compact size, as well as a high wide beam scanning capability to achieve greater spatial coverage and reduce the number of millimeter wave antenna modules required. The purpose of this paper is to discuss the high- performance scanning techniques for millimeter wave antenna and array under the background of current solutions, and predict the future development of millimeter wave antenna, as well as its test system.