用于片上x波段T/R模块的SiGe构建块

T. Dinc, S. Zihir, Y. Gurbuz
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引用次数: 10

摘要

本文提出了一种采用0.25 μm SiGe BiCMOS工艺技术的x波段相控阵收发模块。T/R模块由T/R开关、SPDT开关、PA (power amplifier)和LNA (low noise amplifier)组成。T/R开关和SPDT开关使用CMOS晶体管实现,而PA和LNA则基于SiGe hbt。设计的T/R开关实现最小3.2 dB插入损耗,最大34.8 dB隔离,10ghz时P1dB为28.2 dBm。SPDT开关在x波段的损耗小于2.2 dB,芯片面积为0.17 mm2。该放大器在3ghz带宽下实现了25 dB的小信号增益和23.2 dBm的饱和输出功率,PAE为25%。最后,LNA在x波段的增益大于19 dB,平均噪声系数为1.65 dB。将在会议上介绍更详细的分析和广泛的结果和使用的技术。
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SiGe building blocks for on-chip X-Band T/R modules
This paper presents a T/R (transmit/receive) module for X-Band phased arrays using a 0.25 μm SiGe BiCMOS process technology. The T/R module consists of a T/R switch, a SPDT switch, a power amplifier (PA), and a low noise amplifier (LNA). The T/R switch and SPDT switch are implemented using CMOS transistors whereas the PA and LNA are based on SiGe HBTs. The designed T/R switch achieves minimum 3.2 dB insertion loss, maximum 34.8 dB isolation and has a P1dB of 28.2 dBm at 10 GHz. The SPDT switch has less than 2.2 dB loss at X-Band and occupies 0.17 mm2 chip area. The PA achieves a small-signal gain of 25 dB and a saturated output power of 23.2 dBm with 25% PAE in a 3 GHz bandwidth. Lastly, the LNA has a gain more than 19 dB and 1.65 dB (mean) noise figure at X-Band. More detailed analysis with extended results and utilized techniques will be presented at the conference.
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