{"title":"电路性能验证","authors":"J. Mar, You-Pang Wei","doi":"10.1109/DAC.1984.1585841","DOIUrl":null,"url":null,"abstract":"This paper describes a multi-level simulation strategy for verifying and optimizing VLSI circuit performance. Circuit simulation alone is insufficient for ensuring that VLSI designs meet performance targets. To meet VLSI needs, a tri-level family of simulation tools consisting of critical path analyzers, parasitic timing simulators, and circuit simulators is proposed. The relationship and interface between these tools, including how they combine \"tops-down\" and \"bottoms-up\" design methodologies, and some results from the initial implementation of this strategy in actual VLSI product designs are also discussed.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Performance Verification of Circuits\",\"authors\":\"J. Mar, You-Pang Wei\",\"doi\":\"10.1109/DAC.1984.1585841\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a multi-level simulation strategy for verifying and optimizing VLSI circuit performance. Circuit simulation alone is insufficient for ensuring that VLSI designs meet performance targets. To meet VLSI needs, a tri-level family of simulation tools consisting of critical path analyzers, parasitic timing simulators, and circuit simulators is proposed. The relationship and interface between these tools, including how they combine \\\"tops-down\\\" and \\\"bottoms-up\\\" design methodologies, and some results from the initial implementation of this strategy in actual VLSI product designs are also discussed.\",\"PeriodicalId\":188431,\"journal\":{\"name\":\"21st Design Automation Conference Proceedings\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Design Automation Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1984.1585841\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585841","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes a multi-level simulation strategy for verifying and optimizing VLSI circuit performance. Circuit simulation alone is insufficient for ensuring that VLSI designs meet performance targets. To meet VLSI needs, a tri-level family of simulation tools consisting of critical path analyzers, parasitic timing simulators, and circuit simulators is proposed. The relationship and interface between these tools, including how they combine "tops-down" and "bottoms-up" design methodologies, and some results from the initial implementation of this strategy in actual VLSI product designs are also discussed.