测试模式优化采用适当的混合模式技术

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) Pub Date : 2006-01-17 DOI:10.1109/DELTA.2006.86

S. Z. Islam, M. Ali

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引用次数: 2

摘要

本文提出了一种在混合模式中使用适当数量的种子选择来优化测试模式的方法。在混合模式下，测试集由基于LFSR的伪随机和确定性模式组合而成。这种方法的效率很大程度上取决于这些测试模式在最终测试中的比例。实验结果表明，与传统的混合模式相比，优化后的混合模式的图案总数最少。

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Test pattern optimization using proper in mixed-mode technique

This paper presents a test pattern optimization approach using a proper number of seed selection in mixed-mode patterns. In mixed-mode patterns, the test set is assembled from LFSR based pseudorandom and deterministic patterns. The efficiency of this approach is largely determined by the ratio of those test patterns in the final test. The experiment results show that the total number of patterns in this optimized mixed-mode is minimized compared to conventional mixed-mode technique.

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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)

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