{"title":"白光干涉法在光谱仪波长校正中的应用","authors":"H. González-Núñez, R. de la Fuente","doi":"10.1117/12.2026187","DOIUrl":null,"url":null,"abstract":"In this work, white light interferometry is applied to perform wavelength calibration of a dispersive spectrometer .The relation between wavelength and position in the spectrometer detector is obtained from the wavelength-dependent phase difference at the output of the interferometer. In the proposed method, no suppositions are made about the spectrum of the illumination source; it is only required to make a simple assumption about dispersion in the spectrometer to be measured and to perform a Taylor expansion of the phase difference. A sample of calibration of a home-made spectrometer serves to discuss different issues that affect the calibration.","PeriodicalId":135913,"journal":{"name":"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications","volume":"123 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"White light interferometry applied to wavelength calibration of spectrometers\",\"authors\":\"H. González-Núñez, R. de la Fuente\",\"doi\":\"10.1117/12.2026187\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, white light interferometry is applied to perform wavelength calibration of a dispersive spectrometer .The relation between wavelength and position in the spectrometer detector is obtained from the wavelength-dependent phase difference at the output of the interferometer. In the proposed method, no suppositions are made about the spectrum of the illumination source; it is only required to make a simple assumption about dispersion in the spectrometer to be measured and to perform a Taylor expansion of the phase difference. A sample of calibration of a home-made spectrometer serves to discuss different issues that affect the calibration.\",\"PeriodicalId\":135913,\"journal\":{\"name\":\"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications\",\"volume\":\"123 6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2026187\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2026187","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
White light interferometry applied to wavelength calibration of spectrometers
In this work, white light interferometry is applied to perform wavelength calibration of a dispersive spectrometer .The relation between wavelength and position in the spectrometer detector is obtained from the wavelength-dependent phase difference at the output of the interferometer. In the proposed method, no suppositions are made about the spectrum of the illumination source; it is only required to make a simple assumption about dispersion in the spectrometer to be measured and to perform a Taylor expansion of the phase difference. A sample of calibration of a home-made spectrometer serves to discuss different issues that affect the calibration.