{"title":"用于桥接故障的可参数化故障模拟器","authors":"P. Engelke, B. Becker, Martin Keim","doi":"10.1109/ETW.2000.873780","DOIUrl":null,"url":null,"abstract":"We present the concept of a multiple-valued logic simulator that is able to more accurately determine the possible behavior of a circuit in the presence of bridging faults. By a user defined mapping of a range of voltages to a logic value the simulator takes care of certain voltages more closely than common bridge fault simulators that map all voltages to either logic 1 or 0. Experimental results are given to demonstrate the improved fault detection possibilities.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A parameterizable fault simulator for bridging faults\",\"authors\":\"P. Engelke, B. Becker, Martin Keim\",\"doi\":\"10.1109/ETW.2000.873780\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present the concept of a multiple-valued logic simulator that is able to more accurately determine the possible behavior of a circuit in the presence of bridging faults. By a user defined mapping of a range of voltages to a logic value the simulator takes care of certain voltages more closely than common bridge fault simulators that map all voltages to either logic 1 or 0. Experimental results are given to demonstrate the improved fault detection possibilities.\",\"PeriodicalId\":255826,\"journal\":{\"name\":\"Proceedings IEEE European Test Workshop\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE European Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETW.2000.873780\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE European Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETW.2000.873780","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A parameterizable fault simulator for bridging faults
We present the concept of a multiple-valued logic simulator that is able to more accurately determine the possible behavior of a circuit in the presence of bridging faults. By a user defined mapping of a range of voltages to a logic value the simulator takes care of certain voltages more closely than common bridge fault simulators that map all voltages to either logic 1 or 0. Experimental results are given to demonstrate the improved fault detection possibilities.
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