{"title":"毫米波封装表征中一种新的去嵌入技术","authors":"H. Liang, J. Laskar, M. Hyslop, R. Panicker","doi":"10.1109/ARFTG.1999.327374","DOIUrl":null,"url":null,"abstract":"This paper describes a novel de-embedding technique for millimeter-wave BGA package characterization using accurate 2-port measurement. By calculating the S-matrix of the discontinuity between the probes and the DUT, the procedure can overcome the difficulties of designing a broadband reflection standard in TRL calibration due to the large distance between probing pad and the interface with the DUT. The method presented is self-consistent and can be easily applied to S-parameter calculation and de-embedding of general discontinuities.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A Novel De-embedding Technique for Millimeter-wave Package Characterization\",\"authors\":\"H. Liang, J. Laskar, M. Hyslop, R. Panicker\",\"doi\":\"10.1109/ARFTG.1999.327374\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a novel de-embedding technique for millimeter-wave BGA package characterization using accurate 2-port measurement. By calculating the S-matrix of the discontinuity between the probes and the DUT, the procedure can overcome the difficulties of designing a broadband reflection standard in TRL calibration due to the large distance between probing pad and the interface with the DUT. The method presented is self-consistent and can be easily applied to S-parameter calculation and de-embedding of general discontinuities.\",\"PeriodicalId\":284470,\"journal\":{\"name\":\"54th ARFTG Conference Digest\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"54th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1999.327374\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"54th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1999.327374","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Novel De-embedding Technique for Millimeter-wave Package Characterization
This paper describes a novel de-embedding technique for millimeter-wave BGA package characterization using accurate 2-port measurement. By calculating the S-matrix of the discontinuity between the probes and the DUT, the procedure can overcome the difficulties of designing a broadband reflection standard in TRL calibration due to the large distance between probing pad and the interface with the DUT. The method presented is self-consistent and can be easily applied to S-parameter calculation and de-embedding of general discontinuities.