毫米波封装表征中一种新的去嵌入技术

H. Liang, J. Laskar, M. Hyslop, R. Panicker
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引用次数: 6

摘要

本文描述了一种新的毫米波BGA封装表征的去嵌入技术,该技术使用精确的2端口测量。该程序通过计算探针与被测件之间不连续的s矩阵,克服了在TRL校准中由于探测垫与被测件接口之间距离大而导致的设计宽带反射标准的困难。该方法具有自洽性,可方便地应用于一般不连续点的s参数计算和去嵌入。
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A Novel De-embedding Technique for Millimeter-wave Package Characterization
This paper describes a novel de-embedding technique for millimeter-wave BGA package characterization using accurate 2-port measurement. By calculating the S-matrix of the discontinuity between the probes and the DUT, the procedure can overcome the difficulties of designing a broadband reflection standard in TRL calibration due to the large distance between probing pad and the interface with the DUT. The method presented is self-consistent and can be easily applied to S-parameter calculation and de-embedding of general discontinuities.
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