{"title":"微控制器集成电路电源对附近I/O引脚的传导发射","authors":"Shuai Ma, Min Pan, Wenxiao Fang, P. Lai","doi":"10.1109/APEMC.2016.7522915","DOIUrl":null,"url":null,"abstract":"In this paper, we investigate the conducted emission of I/O pins near power pairs of a microcontroller integrated circuit. Our investigation show that with the increase of the distance from the power pairs the I/O pin gives decreasing conducted emission. The spread of the conducted emission from power pairs to I/O pins can be depicted by mutual inductance and mutual capacitor in a lumped circuit model.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Conducted emission of I/O pins near power pairs of a microcontroller integrated circuit\",\"authors\":\"Shuai Ma, Min Pan, Wenxiao Fang, P. Lai\",\"doi\":\"10.1109/APEMC.2016.7522915\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we investigate the conducted emission of I/O pins near power pairs of a microcontroller integrated circuit. Our investigation show that with the increase of the distance from the power pairs the I/O pin gives decreasing conducted emission. The spread of the conducted emission from power pairs to I/O pins can be depicted by mutual inductance and mutual capacitor in a lumped circuit model.\",\"PeriodicalId\":358257,\"journal\":{\"name\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2016.7522915\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2016.7522915","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Conducted emission of I/O pins near power pairs of a microcontroller integrated circuit
In this paper, we investigate the conducted emission of I/O pins near power pairs of a microcontroller integrated circuit. Our investigation show that with the increase of the distance from the power pairs the I/O pin gives decreasing conducted emission. The spread of the conducted emission from power pairs to I/O pins can be depicted by mutual inductance and mutual capacitor in a lumped circuit model.