用于高速片间数据通信的数字延迟线的片上分接延迟测量

O. Petre, H. Kerkhoff
{"title":"用于高速片间数据通信的数字延迟线的片上分接延迟测量","authors":"O. Petre, H. Kerkhoff","doi":"10.1109/ATS.2002.1181698","DOIUrl":null,"url":null,"abstract":"During the last few years, new synchronization techniques to send data between ICs at increasingly high data-rates have been developed. Some of them rely on digital delay lines. The timing accuracy of the delay lines is crucial for good functionality of the synchronization mechanism. This paper presents a strategy to measure the tap-delays of a digital delay-line, using the well-known oscillation technique. The occurring measurement error for the presented technique has been calculated. Towards the end of the paper, a new delay-line scheme is shown. The tap-delay, measurement becomes much more accurate for this delay-line than for a standard delay-line.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"On-chip tap-delay measurements for a digital delay-line used in high-speed inter-chip data communications\",\"authors\":\"O. Petre, H. Kerkhoff\",\"doi\":\"10.1109/ATS.2002.1181698\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"During the last few years, new synchronization techniques to send data between ICs at increasingly high data-rates have been developed. Some of them rely on digital delay lines. The timing accuracy of the delay lines is crucial for good functionality of the synchronization mechanism. This paper presents a strategy to measure the tap-delays of a digital delay-line, using the well-known oscillation technique. The occurring measurement error for the presented technique has been calculated. Towards the end of the paper, a new delay-line scheme is shown. The tap-delay, measurement becomes much more accurate for this delay-line than for a standard delay-line.\",\"PeriodicalId\":199542,\"journal\":{\"name\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"volume\":\"69 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2002.1181698\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2002.1181698","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

在过去几年中,开发了新的同步技术,以越来越高的数据速率在ic之间发送数据。其中一些依赖于数字延迟线。延迟线的定时精度是保证同步机制良好运行的关键。本文提出了一种利用著名的振荡技术测量数字延迟线分接延时的方法。计算了该方法的测量误差。在论文的最后,给出了一种新的延迟线方案。该延迟线的分接延迟测量比标准延迟线精确得多。
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On-chip tap-delay measurements for a digital delay-line used in high-speed inter-chip data communications
During the last few years, new synchronization techniques to send data between ICs at increasingly high data-rates have been developed. Some of them rely on digital delay lines. The timing accuracy of the delay lines is crucial for good functionality of the synchronization mechanism. This paper presents a strategy to measure the tap-delays of a digital delay-line, using the well-known oscillation technique. The occurring measurement error for the presented technique has been calculated. Towards the end of the paper, a new delay-line scheme is shown. The tap-delay, measurement becomes much more accurate for this delay-line than for a standard delay-line.
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