{"title":"BTI老化对电荷泵电路的影响","authors":"Spyridon Spyridonos, Y. Tsiatouhas","doi":"10.1109/mocast54814.2022.9837768","DOIUrl":null,"url":null,"abstract":"Charge pumps are widely used in modern nanometer technology circuits. Due to the high voltage levels that are generated in the internal nodes of these circuits, the influence of bias temperature instability (BTI) phenomena on their aging is expected to be substantial. In this paper we study the BTI related aging of various charge pump circuits and aging related simulation comparisons are presented.","PeriodicalId":122414,"journal":{"name":"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)","volume":"382 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"BTI Aging Influence on Charge Pump Circuits\",\"authors\":\"Spyridon Spyridonos, Y. Tsiatouhas\",\"doi\":\"10.1109/mocast54814.2022.9837768\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Charge pumps are widely used in modern nanometer technology circuits. Due to the high voltage levels that are generated in the internal nodes of these circuits, the influence of bias temperature instability (BTI) phenomena on their aging is expected to be substantial. In this paper we study the BTI related aging of various charge pump circuits and aging related simulation comparisons are presented.\",\"PeriodicalId\":122414,\"journal\":{\"name\":\"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)\",\"volume\":\"382 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/mocast54814.2022.9837768\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mocast54814.2022.9837768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Charge pumps are widely used in modern nanometer technology circuits. Due to the high voltage levels that are generated in the internal nodes of these circuits, the influence of bias temperature instability (BTI) phenomena on their aging is expected to be substantial. In this paper we study the BTI related aging of various charge pump circuits and aging related simulation comparisons are presented.
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