Hong-hyun Park, W. Choi, M. A. Pourghaderi, Jongchol Kim, U. Kwon, D. Kim
{"title":"迈向更真实的垂直堆叠多个SiNW场效应管的NEGF模拟","authors":"Hong-hyun Park, W. Choi, M. A. Pourghaderi, Jongchol Kim, U. Kwon, D. Kim","doi":"10.1109/SISPAD.2018.8551692","DOIUrl":null,"url":null,"abstract":"We present quantum transport simulation results of vertically stacked multiple silicon nanowire (SiNW) FETs based on the non-equilibrium Green's function (NEGF) method. In order to consider more realistic device conditions such as complex geometry of the multi-channel FETs andvarious carrier scattering processes, we improved physical models and numerical techniques forthe NEGF simulations.","PeriodicalId":170070,"journal":{"name":"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Toward more realistic NEGF simulations of vertically stacked multiple SiNW FETs\",\"authors\":\"Hong-hyun Park, W. Choi, M. A. Pourghaderi, Jongchol Kim, U. Kwon, D. Kim\",\"doi\":\"10.1109/SISPAD.2018.8551692\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present quantum transport simulation results of vertically stacked multiple silicon nanowire (SiNW) FETs based on the non-equilibrium Green's function (NEGF) method. In order to consider more realistic device conditions such as complex geometry of the multi-channel FETs andvarious carrier scattering processes, we improved physical models and numerical techniques forthe NEGF simulations.\",\"PeriodicalId\":170070,\"journal\":{\"name\":\"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SISPAD.2018.8551692\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.2018.8551692","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Toward more realistic NEGF simulations of vertically stacked multiple SiNW FETs
We present quantum transport simulation results of vertically stacked multiple silicon nanowire (SiNW) FETs based on the non-equilibrium Green's function (NEGF) method. In order to consider more realistic device conditions such as complex geometry of the multi-channel FETs andvarious carrier scattering processes, we improved physical models and numerical techniques forthe NEGF simulations.