J. Miyamoto, S. Saitoh, H. Momose, H. Shibata, K. Kanzaki, T. Iizuka
{"title":"带有双极感测放大器的28ns CMOS SRAM","authors":"J. Miyamoto, S. Saitoh, H. Momose, H. Shibata, K. Kanzaki, T. Iizuka","doi":"10.1109/ISSCC.1984.1156709","DOIUrl":null,"url":null,"abstract":"This report will discuss a 64K×1 SRAM with bipolar sense amplifiers, utilizing both CMOS and bipolar devices with double poly 1.2μm MoSi processing. The SRAM typically accesses in 28ns and has a 20nA standby mode.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"A 28ns CMOS SRAM with bipolar sense amplifiers\",\"authors\":\"J. Miyamoto, S. Saitoh, H. Momose, H. Shibata, K. Kanzaki, T. Iizuka\",\"doi\":\"10.1109/ISSCC.1984.1156709\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This report will discuss a 64K×1 SRAM with bipolar sense amplifiers, utilizing both CMOS and bipolar devices with double poly 1.2μm MoSi processing. The SRAM typically accesses in 28ns and has a 20nA standby mode.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156709\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This report will discuss a 64K×1 SRAM with bipolar sense amplifiers, utilizing both CMOS and bipolar devices with double poly 1.2μm MoSi processing. The SRAM typically accesses in 28ns and has a 20nA standby mode.