增强板测试覆盖与新的英特尔供电开放边界扫描指令

2009 International Test Conference Pub Date : 2009-12-18 DOI:10.1109/TEST.2009.5355756

Chwee Liong Tee, T. H. Tan, Chin Chuan Ng

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摘要

电路板测试访问的严重侵蚀要求重新审视当前的测试策略。本文描述了Extest Toggle*的实现及其有效性。注*:Extest Toggle是一种设计测试(DFT)的方法，提供一个方波在* TCK，同时驱动总线上的剩余引脚到静态水平进行保护。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Augmenting board test coverage with new intel powered opens boundary scan instruction

Serious erosion of board test access demands a re-look on the current test strategy. This paper describes implementation of Extest Toggle* and its effectiveness. Note *: Extest Toggle is a design for test (DFT) method of providing a square wave at TCK, while driving the remaining pins on the bus to a static level for guarding.

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2009 International Test Conference

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